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2022 IEEE International Integrated Reliability Workshop (IIRW) ,
1
Device Reliability to Circuit Qualification: Insights and C..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
2
65nm RFSOI Power Amplifier Transistor Ageing at mm W freque..:
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2021 IEEE International Reliability Physics Symposium (IRPS) ,
3