Minguet Lopez, J
122  Ergebnisse:
Personensuche X
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1

Investigation of resistance fluctuations in ReRAM: physical..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Reganaz, L. ; Deleruyelle, D. ; Rafhay, Q.... - p. 1-6 , 2023
 
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2

OxRAM + OTS optimization for binarized neural network hardw..:

Minguet Lopez, J ; Hirtzlin, T ; Dampfhoffer, M...
Semiconductor Science and Technology.  37 (2021)  1 - p. 014001 , 2021
 
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3

Crosspoint Memory Arrays: Principle, Strengths and Challeng..:

, In: 2020 IEEE International Memory Workshop (IMW),
 
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8

Reliability and Variability of 1S1R OxRAM-OTS for High Dens..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Robayo, D. Alfaro ; Deleruyelle, D. ; Vianello, E.... - p. 35.3.1-35.3.4 , 2019
 
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9

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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10

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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11

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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12

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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13

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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14

Elucidating 1S1R operation to reduce the read voltage margi..:

Minguet Lopez, J ; Hudeley, L ; Grenouillet, L...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS46558.2021.9405195.  , 2021
 
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15

1S1R Sub-Threshold Operation in Crossbar Arrays for Neural ..:

, In: 2023 30th International Conference on Mixed Design of Integrated Circuits and System (MIXDES),
 
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