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Mir, Salvador
365  Ergebnisse:
Personensuche X
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1

Nonintrusive Machine Learning-Based Yield Recovery and Perf..:

Cilici, Florent ; Margalef-Rovira, Marc ; Lauga-Larroze, Estelle...
IEEE Transactions on Microwave Theory and Techniques.  72 (2024)  5 - p. 3046-3064 , 2024
Link: https://doi.org/10.1109/..
 
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2

A sub-picosecond resolution jitter instrument for GHz frequ..:

, In: 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS),
Mamgain, Ankush ; Madhvaraj, Manasa ; Mir, Salvador.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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3

Special Session: A high-frequency sinusoidal signal generat..:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Mamgain, Ankush ; Mir, Salvador ; Tripathi, Jai Narayan. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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4

Noise modeling using look-up tables and DC measurements for..:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
Britton, Giovani ; Mir, Salvador ; Lauga-Larroze, Estelle... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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5

Understanding conditions for the single electron regime in ..:

Kriekouki, Ioanna ; Beaudoin, Félix ; Philippopoulos, Pericles...
Solid-State Electronics.  204 (2023)  - p. 108626 , 2023
Link: https://doi.org/10.1016/..
 
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6

A harmonic cancellation-based high-frequency on-chip sinuso..:

, In: 2023 IEEE International Symposium on Circuits and Systems (ISCAS),
Mamgain, Ankush ; Mir, Salvador ; Tripathi, Jai Narayan. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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7

Simulation process flow for the implementation of industry-..:

Kriekouki, Ioanna ; Philippopoulos, Pericles ; Beaudoin, Félix...
Solid-State Electronics.  209 (2023)  - p. 108777 , 2023
Link: https://doi.org/10.1016/..
 
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8

Special Session: On-chip jitter BIST with sub-picosecond re..:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Madhvaraj, Manasa ; Mir, Salvador ; Barragan, Manuel J. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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9

Design methodology of a 28 nm FD-SOI capacitive feedback RF..:

Britton, Giovani ; Lauga-Larroze, Estelle ; Mir, Salvador.
Solid-State Electronics.  194 (2022)  - p. 108340 , 2022
Link: https://doi.org/10.1016/..
 
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10

Special Session on RF/5G Test:

, In: 2022 IEEE European Test Symposium (ETS),
Eisenstadt, William R. ; Roos, Mark ; Morris, Devin... - p. 1-9 , 2022
Link: https://doi.org/10.1109/..
 
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11

Interpretation of 28 nm FD-SOI quantum dot transport data t..:

Kriekouki, Ioanna ; Beaudoin, Félix ; Philippopoulos, Pericles...
Solid-State Electronics.  194 (2022)  - p. 108355 , 2022
Link: https://doi.org/10.1016/..
 
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12

A self-referenced on-chip jitter BIST with sub-picosecond r..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Madhvaraj, Manasa ; Mir, Salvador ; Barragan, Manuel J. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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13

On-chip calibration for high-speed harmonic cancellation-ba..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Mamgain, Ankush ; Mir, Salvador ; Tripathi, Jai Narayan. - p. 43-48 , 2022
Link: https://doi.org/10.1109/..
 
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14

Innovative Practices Track: Innovative Analog Circuit Testi..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Mangelsdorf, Chris ; Madhvaraj, Manasa ; Mir, Salvador... - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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15

Static linearity BIST for $V_{cm}$-based switching SAR ADCs..:

, In: 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS),
Feitoza, Renato S. ; Barragan, Manuel J. ; Gines, Antonio. - p. 295-298 , 2020
Link: https://doi.org/10.1109/..
 
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