Mirkarimi, Laura
11  Ergebnisse:
Personensuche X
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1

Deep Convolution Neural Networks for Automatic Detection of..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Zhao, Oliver ; Suwito, Dominik ; Lee, Bongsub.. - p. 491-497 , 2024
 
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2

High-Throughput Characterization of Nanoscale Topography fo..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Lee, Bongsub ; Zhao, Oliver ; Avellan, Arianna... - p. 969-975 , 2024
 
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3

Fine Pitch Die-to-Wafer Hybrid Bonding:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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4

The Influence of Cu Microstructure on Thermal Budget in Hyb..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Mirkarimi, Laura ; Uzoh, Cyprian ; Suwito, Dominik... - p. 162-167 , 2022
 
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5

Die to Wafer Hybrid Bonding for Chiplet and Heterogeneous I..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Gao, Guilian ; Mirkarimi, Laura ; Fountain, Gill... - p. 1975-1981 , 2022
 
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6

Analysis of Die Edge Bond Pads in Hybrid Bonded Multi-Die S..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Theil, Jeremy A. ; Workman, Thomas ; Suwito, Dominik... - p. 130-136 , 2022
 
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7

Die to Wafer Stacking with Low Temperature Hybrid Bonding:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Gao, Guilian ; Workman, Thomas ; Uzoh, Cyprian... - p. 589-594 , 2020
 
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8

Recent Developments in Fine Pitch Wafer-To-Wafer Hybrid Bon..:

, In: 2019 International Wafer Level Packaging Conference (IWLPC),
 
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9

Chip to Wafer Hybrid Bonding with Cu Interconnect: High Vol..:

, In: 2019 International Wafer Level Packaging Conference (IWLPC),
Gao, Guilian ; Mrozek, Pawel ; Workman, Thomas... - p. 1-9 , 2019
 
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