E-LIB Suche - Ergebnisse für: Mittelberger, Andreas

1

Open-Source Phase Reconstructions of Focused-Probe 4D-STEM ..:

Susi, Toma ; Dellby, Niklas ; Hayner, Russ...
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

2

Data Acquisition and Control of Electron Microscopes:

Meyer, Chris E ; Dellby, Niklas ; Haas, Benedikt...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 700-701 , 2023

Link: https://doi.org/10.1093/..

3

A Materials Scientist's CANVAS: A System for Controlled Alt..:

Mangler, Clemens ; Meyer, Jannik ; Mittelberger, Andreas...
Microscopy and Microanalysis. 28 (2022) S1 - p. 2940-2942 , 2022

Link: https://doi.org/10.1017/..

4

100,000 Diffraction Patterns per Second with Live Processin..:

Plotkin-Swing, Benjamin ; Haas, Benedikt ; Mittelberger, Andreas...
Microscopy and Microanalysis. 28 (2022) S1 - p. 422-424 , 2022

Link: https://doi.org/10.1017/..

5

Advances in Momentum Resolved EELS:

Plotkin-Swing, Benjamin ; Corbin, George ; Dellby, Niklas...
Microscopy and Microanalysis. 27 (2021) S1 - p. 136-138 , 2021

Link: https://doi.org/10.1017/..

6

5D-STEM: Live processing and display at 15,000 diffraction ..:

Mittelberger, Andreas ; Haas, Benedikt ; Plotkin-Swing, Benjamin...
Microscopy and Microanalysis. 27 (2021) S1 - p. 1064-1065 , 2021

Link: https://doi.org/10.1017/..

7

Atomic-Level Structural Engineering of Graphene on a Mesosc..:

Trentino, Alberto ; Madsen, Jacob ; Mittelberger, Andreas...
Nano Letters. 21 (2021) 12 - p. 5179-5185 , 2021

Link: https://doi.org/10.1021/..

8

High-Fidelity 4D-STEM Enabled by Live Processing at 15'000 ..:

Haas, Benedikt ; Mittelberger, Andreas ; Meyer, Chris...
Microscopy and Microanalysis. 27 (2021) S1 - p. 994-997 , 2021

Link: https://doi.org/10.1017/..

9

Hybrid Pixel EELS Detector: Low Noise, High Speed, and Larg..:

Plotkin-Swing, Benjamin ; Lovejoy, Tracy ; Dellby, Niklas...
Microscopy and Microanalysis. 26 (2020) S2 - p. 1928-1930 , 2020

Link: https://doi.org/10.1017/..

10

Comparison of Ptychography vs. Center-of-mass Analysis of R..:

Haas, Benedikt ; Schloz, Marcel ; Mittelberger, Andreas...
Microscopy and Microanalysis. 26 (2020) S2 - p. 1898-1900 , 2020

Link: https://doi.org/10.1017/..

11

Hybrid pixel direct detector for electron energy loss spect..:

Plotkin-Swing, Benjamin ; Corbin, George J. ; De Carlo, Sacha...
Ultramicroscopy. 217 (2020) - p. 113067 , 2020

Link: https://doi.org/10.1016/..

12

Streamlining Processing and Utilization of EM Data - An Eff..:

Koch, Christoph ; Weber, Dieter ; Clausen, Alexander...
Microscopy and Microanalysis. 26 (2020) S2 - p. 2946-2948 , 2020

Link: https://doi.org/10.1017/..

13

Angle-Resolved Electron Energy Loss Spectroscopy:

Lovejoy, Tracy ; Plotkin-Swing, Benjamin ; Dellby, Niklas...
Microscopy and Microanalysis. 26 (2020) S2 - p. 964-965 , 2020

Link: https://doi.org/10.1017/..

14

Damage-free Analysis of Biological Materials by Vibrational..:

Krivanek, Ondrej ; Dohnalkova, Alice ; Kochovski, Zdravko...
Microscopy and Microanalysis. 26 (2020) S2 - p. 108-110 , 2020

Link: https://doi.org/10.1017/..

15

Nion Swift: Open Source Image Processing Software for Instr..:

Meyer, Chris ; Dellby, Niklas ; Hachtel, Jordan A....
Microscopy and Microanalysis. 25 (2019) S2 - p. 122-123 , 2019

Link: https://doi.org/10.1017/..