Mizsei, J.
249  Ergebnisse:
Personensuche X
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1

Microelectronics, Nanoelectronics: step behind the red bric..:

Mizsei, J. ; Lappalainen, J.
Materials Today: Proceedings.  7 (2019)  - p. 888-893 , 2019
 
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The Phonsistor – A Novel VO2 Based Nanoscale Thermal-electr..:

Mizsei, J. ; Bein, M.C. ; Lappalainen, J...
Materials Today: Proceedings.  2 (2015)  8 - p. 4272-4279 , 2015
 
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Study of Surface Defects in 4H-SiC Schottky Diodes Using a ..:

Mizsei, J. ; Korolkov, O. ; Toompuu, J...
Materials Science Forum.  740-742 (2013)  - p. 677-680 , 2013
 
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Electrical characterization of surface and interface potent..:

Mizsei, J. ; Czett, A.
Applied Surface Science.  258 (2012)  21 - p. 8343-8348 , 2012
 
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Effect of deuterium on passivation of Si surfaces:

Mizsei, J. ; Pap, A.E. ; Gillemot, K..
Applied Surface Science.  256 (2010)  19 - p. 5765-5770 , 2010
 
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Gas sensor applications of porous Si layers:

Mizsei, J.
Thin Solid Films.  515 (2007)  23 - p. 8310-8315 , 2007
 
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Chemical imaging by direct methods:

Mizsei, J.
Thin Solid Films.  436 (2003)  1 - p. 25-33 , 2003
 
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