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2023 IEEE International Reliability Physics Symposium (IRPS) ,
7
Drain voltage impact on charge redistribution in GaN-on-Si ..:
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2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
12
Role of free holes in nBTI degradation in GaN-on-Si MOS-cha..:
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2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
13