E-LIB Suche - Ergebnisse für: Mogab, J.

1

Strain-Enhanced CMOS Through Novel Process-Substrate Stress..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,

Mazure, C. ; Cayrefourcq, I. ; Mogab, J.... - p. 130-131 , 2006

Link: https://doi.org/10.1109/..

2

Uniaxial-biaxial stress hybridization for super-critical st..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,

Thean, A.V.-Y. ; Cheek, J. ; Venkatesan, S.... - p. 509-512 , 2005

Link: https://doi.org/10.1109/..

3

Finfet with isolated n+ and p+ gate regions strapped with m..:

, In: 2003 IEEE International Conference on SOI,

Mathew, L. ; Sadd, M. ; White, B.E.... - p. 109-110 , 2003

Link: https://doi.org/10.1109/..

4

Jet vapor deposition nitride processing and application to ..:

Tseng, H.-H ; Veteran, J ; Tobin, P.J...
Materials Science in Semiconductor Processing. 3 (2000) 3 - p. 173-178 , 2000

Link: https://doi.org/10.1016/..

5

DOES FDI REALLY AFFECT EMPLOYMENT IN HOST COUNTRIES? SUBSID..:

Vacaflores, Diego E. ; Mogab, John ; Kishan, Ruby
The Journal of Developing Areas. 51 (2017) 2 - p. 205-220 , 2017

Link: https://www.jstor.org/st..

6

Selective chemical vapor deposition of copper using (hfac) ..:

Jain, A. ; Gelatos, A.V. ; Kodas, T.T....
Thin Solid Films. 262 (1995) 1-2 - p. 52-59 , 1995

Link: https://doi.org/10.1016/..

7

A model for electrical conduction in metal-ferroelectric-me..:

Sudhama, C. ; Campbell, A. C. ; Maniar, P. D....
Journal of Applied Physics. 75 (1994) 2 - p. 1014-1022 , 1994

Link: https://doi.org/10.1063/..

8

High-permittivity lead-based perovskite dielectrics for DRA..:

Jones Jr., R. E. ; Maniar, P. D. ; Campbell, A. C...
Integrated Ferroelectrics. 5 (1994) 3 - p. 235-244 , 1994

Link: https://doi.org/10.1080/..

9

Chemical vapor deposition of copper from Cu+1 precursors in..:

Gelatos, A. V. ; Marsh, R. ; Kottke, M..
Applied Physics Letters. 63 (1993) 20 - p. 2842-2844 , 1993

Link: https://doi.org/10.1063/..

10

Evaluation of Ta, Ti and TiW encapsulations for corrosion a..:

Olowolafe, J.O. ; Mogab, C.J. ; Gregory, R.B.
Thin Solid Films. 227 (1993) 1 - p. 37-43 , 1993

Link: https://doi.org/10.1016/..

11

Effects of anneal ambients and Pt thickness on Pt/Ti and Pt..:

Olowolafe, J. O. ; Jones Jr., R. E. ; Campbell, A. C....
Journal of Applied Physics. 73 (1993) 4 - p. 1764-1772 , 1993

Link: https://doi.org/10.1063/..

12

Electrical characteristics of paraelectric lead lanthanum z..:

Jones Jr., R. E. ; Maniar, P. D. ; Olowolafe, J. O...
Applied Physics Letters. 60 (1992) 8 - p. 1022-1024 , 1992

Link: https://doi.org/10.1063/..

13

Interdiffusions in Cu/reactive-ion-sputtered TiN, Cu/chemic..:

Olowolafe, J. O. ; Mogab, C. J. ; Gregory, R. B..
Journal of Applied Physics. 72 (1992) 9 - p. 4099-4103 , 1992

Link: https://doi.org/10.1063/..

14

The effect of reactor configuration on the oxygen plasma co..:

Bagley, B.G. ; Quinn, W.E. ; Mogab, C.J..
Materials Letters. 4 (1986) 3 - p. 154-158 , 1986

Link: https://doi.org/10.1016/..

15

Thermal annealing of implantation strain in bubble garnet f..:

Pierce, R. D. ; Caruso, R. ; Mogab, C. J.
Journal of Applied Physics. 53 (1982) 6 - p. 4480-4484 , 1982

Link: https://doi.org/10.1063/..