Mollov, S.
213  Ergebnisse:
Personensuche X
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2

Using of bond-wire resistance as aging indicator of semicon..:

Ibrahim, A. ; Khatir, Z. ; Ousten, J.P....
Microelectronics Reliability.  114 (2020)  - p. 113757 , 2020
 
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3

Analysis of the aging mechanism occurring at the bond-wire ..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  114 (2020)  - p. 113873 , 2020
 
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4

Temperature Evolution as an effect of Wire-bond Failures in..:

, In: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe),
Degrenne, N. ; Delamea, R. ; Mollov, S. - p. P.1-P.8 , 2020
 
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5

Analysis of the degradation mechanisms occurring in the top..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  88-90 (2018)  - p. 462-469 , 2018
 
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7

Real-life vs. standard driving cycles and implications on E..:

, In: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society,
Degrenne, N. ; Mollov, S. - p. 2177-2182 , 2016
 
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8

Nonlinear model predictive control of a GDI engine:

, In: 2001 European Control Conference (ECC),
Mollov, S. ; van der Veen, P. J. ; Babuska, R. - p. 1204-1210 , 2001
 
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10

Fuzzy model-based predictive control using Takagi–Sugeno mo..:

Roubos, J.A. ; Mollov, S. ; Babuška, R..
International Journal of Approximate Reasoning.  22 (1999)  1-2 - p. 3-30 , 1999
 
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12

BoolHash: A New Convolutional Algorithm for Boolean Activat..:

, In: 2021 XXX International Scientific Conference Electronics (ET),
 
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13

Integer Convolutional Neural Networks with Boolean Activati..:

, In: 2020 European Conference on Circuit Theory and Design (ECCTD),
 
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