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Mollov, Valentin S.
102  Ergebnisse:
Personensuche X
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1

BoolHash: A New Convolutional Algorithm for Boolean Activat..:

, In: 2021 XXX International Scientific Conference Electronics (ET),
Gatchev, Grigor K. ; Mollov, Valentin S. - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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2

Integer Convolutional Neural Networks with Boolean Activati..:

, In: 2020 European Conference on Circuit Theory and Design (ECCTD),
Gatchev, Grigor ; Mollov, Valentin S. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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3

Genome characterisation of two complete coding sequences of..:

Kinoga, Michael Njoroge ; Kuria, Paul Kimemia ; Miano, Douglas Watuku...
Journal of Plant Pathology.  105 (2022)  1 - p. 15-19 , 2022
Link: https://doi.org/10.1007/..
 
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4

Molecular and biological characterization of ϕRs551, a fila..:

Ahmad, Abdelmonim Ali ; Stulberg, Michael J. ; Mershon, John Patrick...
PLOS ONE.  12 (2017)  9 - p. e0185034 , 2017
Link: https://doi.org/10.1371/..
 
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5

First Report and Complete Genome Sequence of Alfalfa Enamov..:

Nemchinov, Lev G. ; Grinstead, Samuel C. ; Mollov, Dimitre S.
Genome Announcements.  5 (2017)  27 - p. , 2017
Link: https://doi.org/10.1128/..
 
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6

Molecular phylogeny, diagnostics, and diversity of plant-pa..:

Subbotin, Sergei A. ; Chitambar, John J. ; Chizhov, Vlamidir N....
Zoological Journal of the Linnean Society.  171 (2014)  3 - p. 475-506 , 2014
Link: https://doi.org/10.1111/..
 
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7

Disease resistance gene transcription in transgenic potato ..:

Iorizzo, Massimo ; Mollov, Dimitre S. ; Carputo, Domenico.
European Journal of Plant Pathology.  130 (2011)  4 - p. 469-476 , 2011
Link: https://doi.org/10.1007/..
 
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8

Herbicide tolerance in primitive diploid potato species com..:

Bradeen, James M. ; Mollov, Dimitre S.
American Journal of Potato Research.  84 (2007)  5 - p. , 2007
Link: https://doi.org/10.1007/..
 
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9

Study of the DC biasing effect on insertion losses in high-..:

Gospodinova, M. ; Mollov, V.S. ; Arnaudov, R..
Microelectronics Journal.  31 (2000)  11-12 - p. 1009-1014 , 2000
Link: https://doi.org/10.1016/..
 
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10

Temperature Evolution as an effect of Wire-bond Failures in..:

, In: 2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe),
Degrenne, N. ; Delamea, R. ; Mollov, S. - p. P.1-P.8 , 2020
Link: https://doi.org/10.23919..
 
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11

Effects of solder degradation on the die temperature measur..:

Kawahara, C. ; Brandelero, J. ; Pichon, P..
Microelectronics Reliability.  114 (2020)  - p. 113879 , 2020
Link: https://doi.org/10.1016/..
 
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12

Analysis of the aging mechanism occurring at the bond-wire ..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  114 (2020)  - p. 113873 , 2020
Link: https://doi.org/10.1016/..
 
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13

Analysis of the degradation mechanisms occurring in the top..:

Dornic, N. ; Ibrahim, A. ; Khatir, Z....
Microelectronics Reliability.  88-90 (2018)  - p. 462-469 , 2018
Link: https://doi.org/10.1016/..
 
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14

Lifetime extension through Tj equalisation by use of intell..:

Brandelero, J. ; Ewanchuk, J. ; Degrenne, N..
Microelectronics Reliability.  88-90 (2018)  - p. 428-432 , 2018
Link: https://doi.org/10.1016/..
 
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15

Real-life vs. standard driving cycles and implications on E..:

, In: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society,
Degrenne, N. ; Mollov, S. - p. 2177-2182 , 2016
Link: https://doi.org/10.1109/..
 
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