Moquillon, L.
3  Ergebnisse:
Personensuche X
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DC hot carrier stress effect on CMOS 65nm 60 GHz power ampl..:

, In: 2010 IEEE Radio Frequency Integrated Circuits Symposium,
Quemerais, T. ; Moquillon, L. ; Huard, V.... - p. 351-354 , 2010
 
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Methodology of design of millimeter wave power amplifiers c..:

, In: 2010 IEEE 11th Annual Wireless and Microwave Technology Conference (WAMICON),
 
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