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Muñoz-Gorriz, J.
50  Ergebnisse:
Personensuche X
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1

Application of artificial neural networks to the identifica..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronics Reliability.  126 (2021)  - p. 114312 , 2021
Link: https://doi.org/10.1016/..
 
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2

Impact of the forming and cycling processes on the electric..:

Muñoz-Gorriz, J. ; González, M.B. ; Miranda, E...
Thin Solid Films.  706 (2020)  - p. 138027 , 2020
Link: https://doi.org/10.1016/..
 
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3

Analysis of the successive breakdown statistics of multilay..:

Muñoz-Gorriz, J. ; Gonzalez, M.B. ; Campabadal, F...
Microelectronics Reliability.  114 (2020)  - p. 113748 , 2020
Link: https://doi.org/10.1016/..
 
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4

Detection of inhibitory effects in the generation of breakd..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronic Engineering.  215 (2019)  - p. 111023 , 2019
Link: https://doi.org/10.1016/..
 
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5

Analysis and simulation of the multiple resistive switching..:

Petzold, S. ; Miranda, E. ; Sharath, S. U....
Journal of Applied Physics.  125 (2019)  23 - p. , 2019
Link: https://doi.org/10.1063/..
 
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6

Simple method for monitoring the switching activity in memr..:

Miranda, E. ; Morell, A. ; Muñoz-Gorriz, J..
Microelectronics Reliability.  100-101 (2019)  - p. 113327 , 2019
Link: https://doi.org/10.1016/..
 
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7

SPICE model for the current-voltage characteristic of resis..:

Miranda, E. ; Muñoz-Gorriz, J. ; Suñe, J..
Microelectronic Engineering.  215 (2019)  - p. 110998 , 2019
Link: https://doi.org/10.1016/..
 
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8

Characterization of the Failure Site Distribution in MIM De..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Journal of Electronic Materials.  47 (2018)  9 - p. 5033-5038 , 2018
Link: https://doi.org/10.1007/..
 
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9

A new method for estimating the conductive filament tempera..:

Rodriguez-Fernandez, A. ; Muñoz-Gorriz, J. ; Suñé, J..
Microelectronics Reliability.  88-90 (2018)  - p. 142-146 , 2018
Link: https://doi.org/10.1016/..
 
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10

Spatial analysis of failure sites in large area MIM capacit..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Microelectronic Engineering.  178 (2017)  - p. 10-16 , 2017
Link: https://doi.org/10.1016/..
 
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11

Exploratory study and application of the angular wavelet an..:

Muñoz-Gorriz, J. ; Monaghan, S. ; Cherkaoui, K....
Journal of Applied Physics.  122 (2017)  21 - p. , 2017
Link: https://doi.org/10.1063/..
 
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12

Assessing the correlation between location and size of cata..:

Muñoz-Gorriz, J ; Blachier, D ; Reimbold, G...
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2019
Link: http://hdl.handle.net/10..
 
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13

Effect of Resistive Switching Cycling on the Physical Chara..:

Muñoz-Gorriz, J ; Acero Leal, María Cruz ; González, M. B..
#PLACEHOLDER_PARENT_METADATA_VALUE#.  , 2018
Link: http://hdl.handle.net/10..
 
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14

Spatial analysis of failure sites in large area MIM capacit..:

Muñoz-Gorriz, J ; Monaghan, Scott ; Cherkaoui, Karim...
info:eu-repo/grantAgreement/EC/H2020::RIA/654384/EU/Access to European Nanoelectronics Network/ASCENT.  , 2017
Link: http://hdl.handle.net/10..
 
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15

Oxide Breakdown Spot Spatial Patterns as Fingerprints for O..:

Porti i Pujal, Marc ; Redon, Miquel ; Muñoz Gorriz, Jordi..
IEEE electron device letters.  , 2023
Link: https://ddd.uab.cat/reco..
 
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