Myalitsin, A.
27  Ergebnisse:
Personensuche X
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1

Development of Raman Spectroscopy for Defect Analysis in Si..:

, In: 2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Myalitsin, A. ; Yoda, T. ; Ohba, T. - p. 86-87 , 2023
 
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2

Raman Spectroscopy and Hyperspectral Imaging for Wafer-On-W..:

, In: 2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Myalitsin, A. ; Chen, Z.-W. ; Araki, N.... - p. 1-4 , 2022
 
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4

Increase in the compression of DT gas-filled shells by regu..:

Anuchin, M G ; Borodin, V G ; Volenko, V V...
Soviet Journal of Quantum Electronics.  21 (1991)  8 - p. 917-920 , 1991
 
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5

Measurement of the energy parameters of a laser plasma:

Volenko, V V ; Zapysov, A L ; Zuev, A I...
Soviet Journal of Quantum Electronics.  14 (1984)  1 - p. 26-29 , 1984
 
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6

X-ray images of glass gas-filled microspheres irradiated in..:

Volenko, V V ; Zuev, A I ; Ivanov, A F...
Soviet Journal of Quantum Electronics.  13 (1983)  11 - p. 1529-1531 , 1983
 
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7

Adsorption of SARS-CoV-2 Spike (N501Y) RBD to Human Angiote..:

Rozak, Harison ; Nihonyanagi, Satoshi ; Myalitsin, Anton...
The Journal of Physical Chemistry B.  127 (2023)  20 - p. 4406-4414 , 2023
 
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8

Structure of water and polymer at the buried polymer/water ..:

Myalitsin, Anton ; Ghosh, Sanat ; Urashima, Shu-hei...
Physical Chemistry Chemical Physics.  22 (2020)  29 - p. 16527-16531 , 2020
 
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9

The Topmost Water Structure at a Charged Silica/Aqueous Int..:

Urashima, Shu-hei ; Myalitsin, Anton ; Nihonyanagi, Satoshi.
The Journal of Physical Chemistry Letters.  9 (2018)  14 - p. 4109-4114 , 2018
 
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10

Water Structure at the Buried Silica/Aqueous Interface Stud..:

Myalitsin, Anton ; Urashima, Shu-hei ; Nihonyanagi, Satoshi..
The Journal of Physical Chemistry C.  120 (2016)  17 - p. 9357-9363 , 2016
 
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14

Optical Imaging of CdSe Nanowires with Nanoscale Resolution:

Böhmler, Miriam ; Wang, Zhe ; Myalitsin, Anton..
Angewandte Chemie International Edition.  50 (2011)  48 - p. 11536-11538 , 2011
 
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