E-LIB Suche - Ergebnisse für: Myeong, Ilho

1

Strategies for a Wide Memory Window of Ferroelectric FET fo..:

Myeong, Ilho ; Kim, Hyoseok ; Kim, Seunghyun...
IEEE Electron Device Letters. 45 (2024) 7 - p. 1185-1188 , 2024

Link: https://doi.org/10.1109/..

2

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024

Link: https://doi.org/10.1109/..

3

A Comprehensive Study of Transient Characteristics in FeFET..:

Myeong, Ilho ; Kim, Hyoseok ; Kim, Wanki...
IEEE Electron Device Letters. 45 (2024) 8 - p. 1457-1460 , 2024

Link: https://doi.org/10.1109/..

4

In-depth Analysis of the Hafnia Ferroelectrics as a Key Ena..:

, In: 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),

Kim, Giuk ; Choi, Hyojun ; Shin, Hunbeom... - p. 1-2 , 2024

Link: https://doi.org/10.1109/..

5

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024

Link: https://doi.org/10.1109/..

6

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),

Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

7

Incorporating Bottom-Up Approach Into Device/Circuit Co-Des..:

Tayal, Shubham ; Smaani, Billel ; Rahi, Shiromani Balmukund...
IEEE Transactions on Electron Devices. 69 (2022) 11 - p. 6127-6132 , 2022

Link: https://doi.org/10.1109/..

8

Study on self-heating effect and lifetime in vertical-chann..:

Myeong, Ilho ; Shin, Hyungcheol
Microelectronics Reliability. 119 (2021) - p. 114093 , 2021

Link: https://doi.org/10.1016/..

9

Geometrical influence on Self Heating in Nanowire and Nanos..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Kang, Min Jae ; Myeong, Ilho ; Fobelets, Kristel - p. 1-4 , 2020

Link: https://doi.org/10.1109/..

10

Self-Heating and Electrothermal Properties of Advanced Sub-..:

Myeong, Ilho ; Song, Ickhyun ; Kang, Min Jae.
IEEE Electron Device Letters. 41 (2020) 7 - p. 977-980 , 2020

Link: https://doi.org/10.1109/..

11

Analysis of Self-Heating Effects on vertical FET according ..:

Myeong, Ilho ; Son, Dokyun ; Kim, Hyunsuk..
Solid-State Electronics. 137 (2017) - p. 123-127 , 2017

Link: https://doi.org/10.1016/..

12

Analysis of Self Heating Effect in Vertical-channel Field E..:

Myeong, Ilho ; Jeon, Jongwook ; Kang, Myounggon.
2019 20TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), p. 8724510. , 2022

Link: https://hdl.handle.net/1..

13

Deep learning algorithm for the automated detection and cla..:

Kwon, Kyung Won ; Park, Seong Hyeon ; Lee, Dong Hoon...
PLOS ONE. 19 (2024) 3 - p. e0297536 , 2024

Link: https://doi.org/10.1371/..

14

Brain-computer interface on wrist training with or without ..:

Kim, Myeong Sun ; Park, Hyunju ; Kwon, Ilho..
Frontiers in Neurology. 15 (2024) - p. , 2024

Link: https://doi.org/10.3389/..

15

Effects of the preparation method on the crystallinity and ..:

Lee, Gihoon ; Kim, Ilho ; Yang, Inchan...
Applied Surface Science. 429 (2018) - p. 55-61 , 2018

Link: https://doi.org/10.1016/..