Myronov, Maksym
109  Ergebnisse:
Personensuche X
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6

A fast approach to measuring the thickness uniformity of a ..:

Myronov, Maksym ; Colston, Gerard ; Davies, Jack.
Semiconductor Science and Technology.  37 (2022)  6 - p. 065003 , 2022
 
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12

Minority carrier lifetime in indium doped silicon for photo..:

Murphy, John D. ; Pointon, Alex I. ; Grant, Nicholas E....
Progress in Photovoltaics: Research and Applications.  27 (2019)  10 - p. 844-855 , 2019
 
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15

Formation of Mn5Ge3 by thermal annealing of evaporated Mn o..:

Bechler, Stefan ; Kern, Michal ; Funk, Hannes Simon...
Semiconductor Science and Technology.  33 (2018)  9 - p. 095008 , 2018
 
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