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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
An Approach to Neutron-Induced SER Evaluation Using a Clini..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
7
A Partially-redundant Flip-flip Suitable for Mitigating Sin..:
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2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
9
Radiation Hardness Evaluations of a Stacked Flip Flop in a ..:
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2023 International Conference on IC Design and Technology (ICICDT) ,
10
Frequency Dependency of Soft Error Rates Based on Dynamic S..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
11
Radiation Hardened Flip-Flops with low Area, Delay and Powe..:
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2023 International Conference on IC Design and Technology (ICICDT) ,
12
SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bul..:
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
13
Radiation Hardened Flip-Flops Minimizing Area, Power, and D..:
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2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) ,
15