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NAKAJIMA, Ryuichi
282  Ergebnisse:
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1

Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for T..:

SUGITANI, Shotaro ; NAKAJIMA, Ryuichi ; YOSHIDA, Keita..
IEICE Transactions on Electronics.  , 2024
Link: https://doi.org/10.1587/..
 
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2

Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separat..:

FURUTA, Jun ; SUGITANI, Shotaro ; NAKAJIMA, Ryuichi..
IEICE Transactions on Electronics.  , 2024
Link: https://doi.org/10.1587/..
 
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3

Role of DLA-DRB1 amino acids outside the shared epitope in ..:

Nakazawa, Meg ; Nakajima, Ryuichi ; Oshima, Ayaka...
Veterinary Immunology and Immunopathology.  267 (2024)  - p. 110690 , 2024
Link: https://doi.org/10.1016/..
 
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4

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops..:

NAKAJIMA, Ryuichi ; ITO, Takafumi ; SUGITANI, Shotaro...
IEICE Transactions on Electronics.  E107.C (2024)  7 - p. 191-200 , 2024
Link: https://doi.org/10.1587/..
 
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5

Frequency dependence of soft error rates induced by alpha-p..:

Sugisaki, Haruto ; Nakajima, Ryuichi ; Sugitani, Shotaro..
IEICE Electronics Express.  21 (2024)  13 - p. 20240247-20240247 , 2024
Link: https://doi.org/10.1587/..
 
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6

An Approach to Neutron-Induced SER Evaluation Using a Clini..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Nakajima, Ryuichi ; Sugitani, Shotaro ; Sugisaki, Haruto... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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7

A Partially-redundant Flip-flip Suitable for Mitigating Sin..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Furuta, Jun ; Sugitani, Shotaro ; Nakajima, Ryuichi. - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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8

Inversed Effects of Nav1.2 Deficiency at Medial Prefrontal ..:

Suzuki, Toshimitsu ; Hattori, Satoko ; Mizukami, Hiroaki...
Molecular Neurobiology.  61 (2023)  2 - p. 622-634 , 2023
Link: https://doi.org/10.1007/..
 
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9

Radiation Hardness Evaluations of a Stacked Flip Flop in a ..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Sugitani, Shotaro ; Nakajima, Ryuichi ; Ito, Takafumi... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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10

Frequency Dependency of Soft Error Rates Based on Dynamic S..:

, In: 2023 International Conference on IC Design and Technology (ICICDT),
Sugisaki, Haruto ; Nakajima, Ryuichi ; Sugitani, Shotaro.. - p. 68-71 , 2023
Link: https://doi.org/10.1109/..
 
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11

Radiation Hardened Flip-Flops with low Area, Delay and Powe..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Sugitani, Shotaro ; Nakajima, Ryuichi ; Yoshida, Keita.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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12

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bul..:

, In: 2023 International Conference on IC Design and Technology (ICICDT),
Yoshida, Keita ; Nakajima, Ryuichi ; Sugitani, Shotaro... - p. 72-75 , 2023
Link: https://doi.org/10.1109/..
 
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13

Radiation Hardened Flip-Flops Minimizing Area, Power, and D..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Nakajima, Ryuichi ; Ioki, Kazuya ; Furuta, Jun. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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14

Multiple types of navigational information are independentl..:

Murano, Tomoyuki ; Nakajima, Ryuichi ; Nakao, Akito...
Proceedings of the National Academy of Sciences.  119 (2022)  32 - p. , 2022
Link: https://doi.org/10.1073/..
 
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15

Evaluation of Soft Error Tolerance on Flip-Flops Restoring ..:

, In: 2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Ito, Takafumi ; Nakajima, Ryuichi ; Furuta, Jun. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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