Nadudvari, G.
10  Ergebnisse:
Personensuche X
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1

Ion implantation-induced damage in 4H-SiC detected by photo..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
Zolnai, Z. ; Szivos, J. ; Sepsi, O.... - p. 1-3 , 2023
 
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3

Implant Optimization for a 180nm BCD Technology:

, In: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Greenwood, B. ; Roszol, L. ; Nagy, M.... - p. 1-5 , 2019
 
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4

Review of applications of Defect Photoluminescence Imaging ..:

, In: 2019 19th International Workshop on Junction Technology (IWJT),
Jastrzebski, L. ; Roffarello ; Nadudvari, G.... - p. 1-6 , 2019
 
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5

Micro-photoluminescence imaging of dislocation generation i..:

, In: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Greenwood, B. ; Gambino, J.P. ; Watanabe, Y.... - p. 5-9 , 2018
 
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6

Bulk micro-defect detection with low-angle illumination:

Szarvas, T. ; Molnár, G. ; Nádudvari, Gy....
Review of Scientific Instruments.  92 (2021)  4 - p. , 2021
 
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8

List of Contributors:

, In: Coal and Peat Fires: A Global Perspective,
Akram Shaikh, Wasim ; Andel, Nicole M. ; Ania, Conchi O.... - p. xxvii-xxix , 2019
 
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10

Toward an Astrochronology-Based Age-Model for a Messinian P..:

Maniscalco, R ; Forzese, M ; Barbagallo, V...
info:eu-repo/semantics/altIdentifier/wos/WOS:000997112300001.  , 2023
 
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