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2023 21st International Workshop on Junction Technology (IWJT) ,
1
Ion implantation-induced damage in 4H-SiC detected by photo..:
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2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
3
Implant Optimization for a 180nm BCD Technology:
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2019 19th International Workshop on Junction Technology (IWJT) ,
4
Review of applications of Defect Photoluminescence Imaging ..:
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2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
5