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X
Nagaraj, NS
15  Ergebnisse:
Personensuche X
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1

DFM in practice : hit or hype?:

, In: Proceedings of the 45th annual Design Automation Conference,
Rey, Juan C. ; Nagaraj, NS ; Kahng, Andrew... - p. 898-899 , 2008
Link: https://dl.acm.org/doi/1..
 
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2

What's cool for the future of ultra low power designs?:

, In: Proceedings of the 47th Design Automation Conference,
NS, Nagaraj ; Byler, John ; Nazifi, Koorosh... - p. 523-524 , 2010
Link: https://dl.acm.org/doi/1..
 
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3

Who solves the variability problem?:

, In: Proceedings of the 47th Design Automation Conference,
NS, Nagaraj ; Rey, Juan C. ; Kawa, Jamil... - p. 218-219 , 2010
Link: https://dl.acm.org/doi/1..
 
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4

Session details: The future of interconnects: how will bill..:

, In: Proceedings of the 44th annual Design Automation Conference,
NS, Nagaraj , 2007
Link: https://dl.acm.org/doi/1..
 
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5

Statistical Analysis of Capacitance Coupling Effects on Del..:

, In: Proceedings of the 7th International Symposium on Quality Electronic Design,
Narasimha, Usha ; Abraham, Binu ; NS, Nagaraj - p. 795-800 , 2006
Link: https://dl.acm.org/doi/1..
 
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6

Session details: Session 12: Special Session: reliability c..:

, In: Proceedings of the 43rd annual Design Automation Conference,
Yeh, David ; Phillips, Joel ; NS, Nagaraj , 2006
Link: https://dl.acm.org/doi/1..
 
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7

Session details: Session 58: advanced methods for interconn..:

, In: Proceedings of the 43rd annual Design Automation Conference,
NV, Arvind ; Najm, Farid N. ; NS, Nagaraj , 2006
Link: https://dl.acm.org/doi/1..
 
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8

BEOL variability and impact on RC extraction:

, In: Proceedings of the 42nd annual Design Automation Conference,
NS, Nagaraj ; Bonifield, Tom ; Singh, Abha... - p. 758-759 , 2005
Link: https://dl.acm.org/doi/1..
 
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9

When bad things happen to good chips (panel session):

, In: Proceedings of the 37th Annual Design Automation Conference,
NS, Nagaraj ; Strojwas, Andrzej ; Nassif, Sani R.... - p. 736-737 , 2000
Link: https://dl.acm.org/doi/1..
 
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10

Chip-level verification for parasitic coupling effects in d..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Ye, Lun ; Chang, Foong-Charn ; Feldmann, Peter... - p. 128-es , 1999
Link: https://dl.acm.org/doi/1..
 
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11

Taming noise in deep submicron digital integrated circuits ..:

, In: Proceedings of the 35th annual Design Automation Conference,
Shepard, Kenneth ; Inone, Takahide ; NS, Nagaraj - p. 100-101 , 1998
Link: https://dl.acm.org/doi/1..
 
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12

A practical approach to static signal electromigration anal..:

, In: Proceedings of the 35th annual Design Automation Conference,
NS, Nagaraj ; Cano, Frank ; Haznedar, Haldun. - p. 572-577 , 1998
Link: https://dl.acm.org/doi/1..
 
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13

Rapid Estimation of Compaction Parameters for Field Control:

Nagaraj, TS ; Lutenegger, AJ ; Pandian, NS.
Geotechnical Testing Journal.  29 (2006)  6 - p. 497-506 , 2006
Link: https://doi.org/10.1520/..
 
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14

Permeability and Compressibility Behavior of Bentonite-Sand..:

Pandian, NS ; Nagaraj, TS ; Raju, PSRN
Geotechnical Testing Journal.  18 (1995)  1 - p. 86-93 , 1995
Link: https://doi.org/10.1520/..
 
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15

Analysis and Estimation of the Coefficient of Consolidation:

Narasimha Raju, PSR ; Pandian, NS ; Nagaraj, TS
Geotechnical Testing Journal.  18 (1995)  2 - p. 252-258 , 1995
Link: https://doi.org/10.1520/..
 
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