E-LIB Suche - Ergebnisse für: Naik, V. B.

1

Embedded STT-MRAM for Automotive Applications:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Muller, J. ; Pfefferling, B. ; Merbeth, T.... - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

2

Leakage function in magnetic domain wall based artificial n..:

Mah, Wai Lum William ; Chan, Jian Peng ; K. R., Ganesh..
Applied Physics Letters. 123 (2023) 9 - p. , 2023

Link: https://doi.org/10.1063/..

3

Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuro..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Tan, J. ; Lim, J.H. ; Kwon, J.H.... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

4

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022

Link: https://doi.org/10.1109/..

5

Better Management Practices and Their Adoption in Shrimp Fa..:

, In: Transforming Coastal Zone for Sustainable Food and Income Security,

Naik, B. V. ; Patil, S. V. ; Yadav, B. M.... - p. 559-567 , 2022

Link: https://doi.org/10.1007/..

6

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022

Link: https://doi.org/10.1109/..

7

Role of temperature, MTJ size and pulse-width on STT-MRAM b..:

Tan, J. ; Lim, J.H. ; Kwon, J.H....
Solid-State Electronics. 183 (2021) - p. 108032 , 2021

Link: https://doi.org/10.1016/..

8

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,

Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020

Link: https://doi.org/10.1109/..

9

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,

Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020

Link: https://doi.org/10.1109/..

10

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020

Link: https://doi.org/10.1109/..

11

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

12

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),

Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019

Link: https://doi.org/10.1109/..

13

Gold coated cobalt nanoparticles as SAR controlling agent f..:

, In: 2017 IEEE MTT-S International Microwave and RF Conference (IMaRC),

Naik, B.V. ; Dubey, Satya Kesh - p. 267-270 , 2017

Link: https://doi.org/10.1109/..

14

Optimization of Ni–Co–Mn–Sn Heusler alloy composition for n..:

Chen, X. ; Naik, V.B. ; Mahendiran, R..
Journal of Alloys and Compounds. 618 (2015) - p. 187-191 , 2015

Link: https://doi.org/10.1016/..

15

Effect of electric-field on the perpendicular magnetic anis..:

Naik, V. B. ; Meng, H. ; Xiao, J. X....
Applied Physics Letters. 105 (2014) 5 - p. , 2014

Link: https://doi.org/10.1063/..