Naviner, Lirida A.B.
43  Ergebnisse:
Personensuche X
?
2

Energy Efficient Magnetic Tunnel Junction Based Hybrid LSI ..:

, In: Proceedings of the Great Lakes Symposium on VLSI 2017,
Cai, Hao ; Wang, You ; Naviner, Lirida A.B... - p. 23-28 , 2017
 
?
4

Inserting permanent fault input dependence on PTM to improv..:

, In: Proceedings of the 29th Symposium on Integrated Circuits and Systems Design: Chip on the Mountains,
 
?
5

Design Considerations for Reliable OxRAM-based Non-Volatile..:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa..
info:eu-repo/semantics/altIdentifier/doi/10.1109/ISCAS.2016.7527448.  , 2016
 
?
6

Design Considerations for Reliable OxRAM-based Non-Volatile..:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa..
info:eu-repo/semantics/altIdentifier/doi/10.1109/ISCAS.2016.7527448.  , 2016
 
?
7

Design Considerations for Reliable OxRAM-based Non-Volatile..:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa..
info:eu-repo/semantics/altIdentifier/doi/10.1109/ISCAS.2016.7527448.  , 2016
 
?
8

OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEWCAS.2014.6934003.  , 2014
 
?
9

OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEWCAS.2014.6934003.  , 2014
 
?
10

OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEWCAS.2014.6934003.  , 2014
 
?
11

OxRAM-Based Non Volatile Flip-Flop in 28nm FDSOI:

Jovanovic, Natalija ; Thomas, Olivier ; Vianello, Elisa...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NEWCAS.2014.6934003.  , 2014
 
?
12

CSME: A novel cycle-sensing margin enhancement scheme for h..:

Cai, H ; Liu, M ; Zhou, Y..
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2020.113732.  , 2020
 
?
13

Fast analysis of combinatorial netlists correctness rate ba..:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
 
1-15