Ndione, Paul
71  Ergebnisse:
Personensuche X
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1

Assessing Degradation in Bifacial Photovoltaic by Sequentia..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),
 
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2

Evaluation of bifacial module technologies with combined‐ac..:

Hacke, Peter ; Kumar, Akash ; Terwilliger, Kent...
Progress in Photovoltaics: Research and Applications.  31 (2022)  12 - p. 1270-1284 , 2022
 
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3

Towards Standardization of Accelerated Stress Testing Proto..:

, In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC),
 
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4

Electrochemical degradation modes in bifacial silicon photo..:

Sulas‐Kern, Dana B. ; Owen‐Bellini, Michael ; Ndione, Paul...
Progress in Photovoltaics: Research and Applications.  30 (2021)  8 - p. 948-958 , 2021
 
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5

Distribution of the spectral response of cells in silicon m..:

, In: 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC),
Kopidakis, Nikos ; Ndione, Paul ; Lu, Kyle.. - p. 1659-1662 , 2021
 
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6

Increased PV Soiling from High Module Voltages:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
 
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9

Spectroscopy and control of near-surface defects in conduct..:

Kelly, Leah L ; Racke, David A ; Schulz, Philip...
Journal of Physics: Condensed Matter.  28 (2016)  9 - p. 094007 , 2016
 
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10

Computational Approach for Epitaxial Polymorph Stabilizatio..:

Ding, Hong ; Dwaraknath, Shyam S. ; Garten, Lauren...
ACS Applied Materials & Interfaces.  8 (2016)  20 - p. 13086-13093 , 2016
 
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13

Optimizing the Design of 4-Terminal Perovskite/c-Si Tandem ..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),
Ndione, Paul F. ; Geisz, John F. ; Jiang, Qi... - p. 1-1 , 2023
 
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14

Artificial linear brush abrasion of coatings for photovolta..:

Newkirk, Jimmy M. ; Nayshevsky, Illya ; Sinha, Archana...
Solar Energy Materials and Solar Cells.  219 (2021)  - p. 110757 , 2021
 
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15

Combining Indoor and Outdoor Measurements to Lower Uncertai..:

, In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
Ndione, Paul F. ; Osterwald, Carl R. ; Ottoson, Larry... - p. 2185-2187 , 2020
 
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