E-LIB Suche - Ergebnisse für: Nellist, P D

1

Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:

Huth, M ; Eckert, B ; Aschauer, S...
Microscopy and Microanalysis. 29 (2023) Supplement_1 - p. 401-402 , 2023

Link: https://doi.org/10.1093/..

2

Applications of Low Dose Electron Ptychography:

Kirkland, AI ; Kim, J S ; Allen, C S...
Microscopy and Microanalysis. 28 (2022) S1 - p. 352-354 , 2022

Link: https://doi.org/10.1017/..

3

Aberration-corrected scanning transmission electron microsc..:

Pennycook, S. J. ; Lupini, A. R. ; Kadavanich, A....
International Journal of Materials Research. 94 (2022) 4 - p. 350-357 , 2022

Link: https://doi.org/10.1515/..

4

Phase reconstruction using fast binary 4D STEM data:

O'Leary, C. M. ; Allen, C. S. ; Huang, C....
Applied Physics Letters. 116 (2020) 12 - p. , 2020

Link: https://doi.org/10.1063/..

5

The atomic lensing model: New opportunities for atom-by-ato..:

van den Bos, K.H.W. ; Janssens, L. ; De Backer, A...
Ultramicroscopy. 203 (2019) - p. 155-162 , 2019

Link: https://doi.org/10.1016/..

6

4D Analytical STEM with the pnCCD:

Huth, M. ; Simson, M. ; Ritz, R....
Microscopy and Microanalysis. 24 (2018) S1 - p. 220-221 , 2018

Link: https://doi.org/10.1017/..

7

Thickness dependence of scattering cross-sections in quanti..:

Martinez, G.T. ; van den Bos, K.H.W. ; Alania, M...
Ultramicroscopy. 187 (2018) - p. 84-92 , 2018

Link: https://doi.org/10.1016/..

8

Single Atom Detection from Low Contrast-to-Noise Ratio Elec..:

Fatermans, J. ; den Dekker, A. J. ; Müller-Caspary, K....
Physical Review Letters. 121 (2018) 5 - p. , 2018

Link: https://doi.org/10.1103/..

9

An optical configuration for fastidious STEM detector calib..:

JONES, L. ; VARAMBHIA, A. ; SAWADA, H..
Journal of Microscopy. 270 (2018) 2 - p. 176-187 , 2018

Link: https://doi.org/10.1111/..

10

Exploring the Limits of Focused-Probe STEM Ptychography:

Nellist, P. D. ; Martinez, G. T. ; O'Leary, C..
Microscopy and Microanalysis. 24 (2018) S1 - p. 190-191 , 2018

Link: https://doi.org/10.1017/..

11

Focused-Probe STEM Ptychography: Reconstruction Methods, Tr..:

Nellist, P D ; Martinez, G T ; Leary, C O'...
Microscopy and Microanalysis. 24 (2018) S1 - p. 488-489 , 2018

Link: https://doi.org/10.1017/..

12

Analysis of Phase Difference Variations for Strong Dynamica..:

Martinez, G.T. ; Yang, H. ; Nellist, P.D.
Microscopy and Microanalysis. 23 (2017) S1 - p. 474-475 , 2017

Link: https://doi.org/10.1017/..

13

Using Advanced STEM Techniques to Unravel Key Issues in the..:

Lozano, J. G. ; Liberti, E. ; Luo, K....
Microscopy and Microanalysis. 23 (2017) S1 - p. 1698-1699 , 2017

Link: https://doi.org/10.1017/..

14

Evaluation of Aberration-corrected Optical Sectioning for E..:

Hernandez-Maldonado, D. ; Groger, R. ; Ramasse, Q. M...
Microscopy and Microanalysis. 23 (2017) S1 - p. 432-433 , 2017

Link: https://doi.org/10.1017/..

15

Excited helium under high pressures in the bulk and in nano..:

Pyper, N. C. ; Naginey, T. C. ; Nellist, P. D..
Philosophical Magazine Letters. 97 (2017) 8 - p. 295-303 , 2017

Link: https://doi.org/10.1080/..