E-LIB Suche - Ergebnisse für: Neuhäusler, U.

1

Imaging of micro- and nano-structures with hard X-rays:

Rau, C. ; Crecea, V. ; Richter, C.-P....
Micro & Nano Letters. 2 (2007) 1 - p. 1 , 2007

2

Synchrotron-based imaging and tomography with hard X-rays:

Rau, C. ; Crecea, V. ; Liu, W....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 261 (2007) 1-2 - p. 850-854 , 2007

Link: https://doi.org/10.1016/..

3

A new approach for actinic defect inspection of EUVL multil..:

Neuhäusler, U. ; Lin, J. ; Oelsner, A....
Microelectronic Engineering. 83 (2006) 4-9 - p. 680-683 , 2006

Link: https://doi.org/10.1016/..

4

Design, fabrication, and analysis of chirped multilayer mir..:

Wonisch, A. ; Neuhäusler, U. ; Kabachnik, N. M....
Applied Optics. 45 (2006) 17 - p. 4147 , 2006

Link: https://doi.org/10.1364/..

5

High-resolution actinic defect inspection for extreme ultra..:

Neuhäusler, U. ; Oelsner, A. ; Slieh, J....
Applied Physics Letters. 88 (2006) 5 - p. , 2006

Link: https://doi.org/10.1063/..

6

Speciation of sulphur in soils and soil particles by X‐ray ..:

Prietzel, J. ; Thieme, J. ; Neuhäusler, U...
European Journal of Soil Science. 54 (2003) 2 - p. 423-433 , 2003

Link: https://doi.org/10.1046/..

7

Soft X-ray spectromicroscopy on solid-stabilized emulsions:

Neuhäusler, U. ; Abend, S. ; Jacobsen, C..
Colloid & Polymer Science. 277 (1999) 8 - p. 719-726 , 1999

Link: https://doi.org/10.1007/..

8

Bildung und Qualifikation als Grundlage der technologischen..

Bericht des Konsortiums "Bildungsindikatoren und technologi... Studien zum deutschen Innovationssystem ; 01-2010

Helmrich, Robert ; Herget, Herrmann ; Schandock, Manuel... , 2010

Link: http://edok01.tib.uni-ha..