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2022 IEEE International Conference on Semiconductor Electronics (ICSE) ,
1
A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Arch..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
5
Internal Power Net Defect Localization Via Holistic Fault I..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
6
Effective Defect Localization for Scan ATPG Failure through..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
10