E-LIB Suche - Ergebnisse für: Ng, Yee S.

1

45. An international, prospective cohort to document the ef..:

Chia, Nick V.C. ; Li, Leonard S.W. ; Goh, Khean J....
Toxicon. 93 (2015) - p. S15-S16 , 2015

Link: https://doi.org/10.1016/..

2

Cluster formation in amorphous and polycrystalline thin fil..:

Krishnaswamy, S.V. ; Messier, R. ; McLane, S.B...
Thin Solid Films. 79 (1981) 1 - p. 21-26 , 1981

Link: https://doi.org/10.1016/..

3

Atom probe FIM investigation of voids in a-Ge:

Krishnaswamy, S.V. ; Messier, R. ; Ng, Yee S...
Journal of Non-Crystalline Solids. 35-36 (1980) - p. 531-536 , 1980

Link: https://doi.org/10.1016/..

4

Surface segregation of a Pt–Au alloy: An atom-probe field i..:

Tsong, T. T. ; Ng, Yee S. ; McLane Jr., S. B.
The Journal of Chemical Physics. 73 (1980) 3 - p. 1464-1468 , 1980

Link: https://doi.org/10.1063/..

5

Surface segregation of Ni-Cu alloy in nitrogen and oxygen: ..:

Tsong, T. T. ; Ng, Yee S. ; McLane Jr., S. B.
Journal of Applied Physics. 51 (1980) 12 - p. 6189-6191 , 1980

Link: https://doi.org/10.1063/..

6

ToF atom-probe fim study of LaB6 single crystals:

Nakamura, Shogo ; Ng, Yee S. ; Tsong, T.T..
Surface Science. 87 (1979) 2 - p. 656-664 , 1979

Link: https://doi.org/10.1016/..

7

ToF atom-probe investigation of surface segregation in dilu..:

Ng, Yee s. ; Tsong, T.T. ; McLane Jr., S.B.
Ultramicroscopy. 4 (1979) 3 - p. 384 , 1979

Link: https://doi.org/10.1016/..

8

Atom-probe and field ion microscopy of semiconductors:

Tsong, T.T. ; Herman, Mike ; Ng, Yee S.
Ultramicroscopy. 4 (1979) 3 - p. 384-385 , 1979

Link: https://doi.org/10.1016/..

9

Absolute Composition Depth Profile of a NiCu Alloy in a Sur..:

Ng, Yee S. ; Tsong, T. T. ; McLane, S. B.
Physical Review Letters. 42 (1979) 9 - p. 588-591 , 1979

Link: https://doi.org/10.1103/..

10

Quantification of atom-probe FIM data:

Tsong, T.T. ; Ng, Yee S.
Ultramicroscopy. 4 (1979) 3 - p. 383-384 , 1979

Link: https://doi.org/10.1016/..

11

Thin film characterization by atom probe field ion microsco..:

Krishnaswamy, S. V. ; Messier, R. ; Ng, Yee S..
Applied Physics Letters. 35 (1979) 11 - p. 870-872 , 1979

Link: https://doi.org/10.1063/..

12

ToF atom-probe fim investigation of surface segregation in ..:

Ng, Yee S. ; Tsong, T.T.
Surface Science. 78 (1978) 2 - p. 419-438 , 1978

Link: https://doi.org/10.1016/..

13

Quantification of atom-probe FIM data and an application to..:

Tsong, T. T. ; Ng, Yee S. ; Krishnaswamy, S. V.
Applied Physics Letters. 32 (1978) 11 - p. 778-780 , 1978

Link: https://doi.org/10.1063/..

14

TOF atom-probe investigation of metal oxides:

Ng, Yee S. ; McLane, S. B. ; Tsong, T. T.
Journal of Applied Physics. 49 (1978) 4 - p. 2517-2522 , 1978

Link: https://doi.org/10.1063/..

15

ToF Atom-probe mass spectra of GaAs:

Tsong, T.T. ; Ng, Yee S. ; Melmed, A.J.
Surface Science. 77 (1978) 1 - p. L187-L192 , 1978

Link: https://doi.org/10.1016/..