Ni, Xianfeng
127  Ergebnisse:
Personensuche X
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6

Van der Waals heterostructures of Janus XSeTe (X = Mo, W) a..:

Zhao, Huiqin ; Xie, Feng ; Liu, Yushen...
Materials Science in Semiconductor Processing.  123 (2021)  - p. 105588 , 2021
 
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7

Failure of submarine cables used in high‐voltage power tran..:

Wang, Weiwang ; Yan, Xilin ; Li, Shengtao...
IET Generation, Transmission & Distribution.  15 (2021)  9 - p. 1387-1402 , 2021
 
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9

Interface Engineering Enabling Next Generation GaN-on-Diamo..:

Gu, Yimin ; Zhang, Yun ; Hua, Bin...
Journal of Electronic Materials.  50 (2021)  8 - p. 4239-4249 , 2021
 
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10

Electronic and optical properties of InN-MTe2(M=Mo, W) hete..:

Ding, Yu ; Gu, Yan ; Yang, Guofeng...
Materials Science in Semiconductor Processing.  114 (2020)  - p. 105067 , 2020
 
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15

Stress test measurements of lattice‐matched InAlN/AlN/GaN H..:

Leach, Jacob H. ; Wu, Mo ; Ni, Xianfeng...
physica status solidi (a).  207 (2010)  6 - p. 1345-1347 , 2010
 
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