Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Nicolaidis, Michael
51  Ergebnisse:
Personensuche X
?
1

Reducing Power Dissipation in Memory Repair for High Fault ..:

Papavramidou, Panagiota ; Nicolaidis, Michael
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  12 - p. 2112-2125 , 2023
Link: https://doi.org/10.1109/..
 
?
2

The Quest of the Ideal Error Detecting Architecture: The GR..:

Dimopoulos, Michael ; Nicolaidis, Michael
IEEE Transactions on Sustainable Computing.  6 (2021)  3 - p. 493-506 , 2021
Link: https://doi.org/10.1109/..
 
?
3

An ECC-Based Repair Approach with an Offset-Repair CAM for ..:

, In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Papavramidou, Panagiota ; Nicolaidis, Michael ; Girard, Patrick - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
?
4

A Dynamic Sufficient Condition of Deadlock-Freedom for High..:

Charif, Amir ; Coelho, Alexandre ; Zergainoh, Nacer-Eddine.
IEEE Transactions on Emerging Topics in Computing.  8 (2020)  3 - p. 642-654 , 2020
Link: https://doi.org/10.1109/..
 
?
5

Reducing Rollback Cost in VLSI Circuits to Improve Fault To..:

Bonnoit, Thierry ; Zergainoh, Nacer-Eddine ; Nicolaidis, Michael
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  26 (2018)  8 - p. 1438-1451 , 2018
Link: https://doi.org/10.1109/..
 
?
6

A Framework for Scalable TSV Assignment and Selection in Th..:

Charif, Amir ; Coelho, Alexandre ; Zergainoh, Nacer-Eddine.
VLSI Design.  2017 (2017)  - p. 1-15 , 2017
Link: https://doi.org/10.1155/..
 
?
7

Fault-tolerant adaptive routing under an unconstrained set ..:

Dimopoulos, Michael ; Gang, Yi ; Anghel, Lorena...
Microprocessors and Microsystems.  38 (2014)  6 - p. 620-635 , 2014
Link: https://doi.org/10.1016/..
 
?
8

Session details: Dependable system design:

, In: Proceedings of the conference on Design, Automation & Test in Europe,
Makris, Yiorgos ; Nicolaidis, Michael , 2014
Link: https://dl.acm.org/doi/1..
 
?
9

Using Error Correcting Codes Without Speed Penalty in Embed..:

Bonnoit, Thierry ; Nicolaidis, Michael ; Zergainoh, Nacer-Eddine
Journal of Electronic Testing.  29 (2013)  3 - p. 383-400 , 2013
Link: https://doi.org/10.1007/..
 
?
10

Hot topic session 4A: Reliability analysis of complex digit..:

, In: 2013 IEEE 31st VLSI Test Symposium (VTS),
Evans, Adrian ; Nicolaidis, Michael ; Aitken, Rob.. - p. 1-1 , 2013
Link: https://doi.org/10.1109/..
 
?
11

A Practical Approach to Single Event Transient Analysis for..:

Costenaro, Enrico ; Alexandrescu, Dan ; Belhaddad, Kader.
Journal of Electronic Testing.  29 (2013)  3 - p. 301-315 , 2013
Link: https://doi.org/10.1007/..
 
?
12

Reliability challenges of real-time systems in forthcoming ..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Hamdioui, Said ; Nicolaidis, Michael ; Gizopoulos, Dimitris... - p. 129-134 , 2013
Link: https://dl.acm.org/doi/1..
 
?
13

Biologically Inspired Robust Tera-Device Processors:

Nicolaidis, Michael
IEEE Design & Test of Computers.  29 (2012)  5 - p. 94-99 , 2012
Link: https://doi.org/10.1109/..
 
?
14

Through-silicon-via built-in self-repair for aggressive 3D ..:

, In: 2012 IEEE 18th International On-Line Testing Symposium (IOLTS),
Nicolaidis, Michael ; Pasca, Vladimir ; Anghel, Lorena - p. 91-96 , 2012
Link: https://doi.org/10.1109/..
 
?
15

Design for test and reliability in ultimate CMOS:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Nicolaidis, Michael ; Anghel, Lorena ; Zorian, Yervant... - p. 677-682 , 2012
Link: https://dl.acm.org/doi/1..
 
1-15