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X
Nielsen, Peter F.
10128  Ergebnisse:
Personensuche X
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1

Determination of thermal diffusivity of thermoelectric mate..:

Beltrán-Pitarch, Braulio ; Guralnik, Benny ; Lamba, Neetu...
Materials Today Physics.  31 (2023)  - p. 100963 , 2023
Link: https://doi.org/10.1016/..
 
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2

Determination of thermoelectric properties from micro four-..:

Guralnik, Benny ; Hansen, Ole ; Stilling-Andersen, Andreas R...
Measurement Science and Technology.  33 (2022)  12 - p. 125001 , 2022
Link: https://doi.org/10.1088/..
 
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3

THz nanoscopy of platinum thin films:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Lassen, Henrik B. ; Buron, Jonas D. ; Kelner, Roy... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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4

Review of Micro- and Nanoprobe Metrology for Direct Electri..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Guralnik, Benny ; Nielsen, Peter F. ; Petersen, Dirch H.... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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5

3ω correction method for eliminating resistance measurement..:

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H....
Review of Scientific Instruments.  92 (2021)  9 - p. , 2021
Link: https://doi.org/10.1063/..
 
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6

Effective electrical resistivity in a square array of orien..:

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H...
Nanotechnology.  32 (2021)  18 - p. 185706 , 2021
Link: https://doi.org/10.1088/..
 
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7

Electrical Contact Formation in Micro Four‐Point Probe Meas..:

Folkersma, Steven ; Bogdanowicz, Janusz ; Petersen, Dirch H....
physica status solidi (a).  217 (2019)  5 - p. , 2019
Link: https://doi.org/10.1002/..
 
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8

Electrical characterization of single nanometer-wide Si fin..:

Folkersma, Steven ; Bogdanowicz, Janusz ; Schulze, Andreas...
Beilstein Journal of Nanotechnology.  9 (2018)  - p. 1863-1867 , 2018
Link: https://doi.org/10.3762/..
 
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9

Width‐Dependent Sheet Resistance of Nanometer‐Wide Si Fins ..:

Bogdanowicz, Janusz ; Folkersma, Steven ; Sergeant, Stefanie...
physica status solidi (a).  215 (2017)  6 - p. , 2017
Link: https://doi.org/10.1002/..
 
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10

Breakthrough in current-in-plane tunneling measurement prec..:

Cagliani, Alberto ; Østerberg, Frederik W. ; Hansen, Ole...
Review of Scientific Instruments.  88 (2017)  9 - p. , 2017
Link: https://doi.org/10.1063/..
 
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11

Breakthrough in Current in Plane Metrology for Monitoring L..:

, In: 2017 IEEE International Memory Workshop (IMW),
Cagliani, Alberto ; Osterberg, Frederik W. ; Hansen, Ole... - p. 1-3 , 2017
Link: https://doi.org/10.1109/..
 
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12

Correction to Graphene Uniformity Conductance Mapping:

Buron, Jonas D. ; Petersen, Dirch H. ; Bøggild, Peter...
Nano Letters.  15 (2014)  1 - p. 803-803 , 2014
Link: https://doi.org/10.1021/..
 
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13

Precision of single-engage micro Hall effect measurements:

, In: 2014 International Workshop on Junction Technology (IWJT),
Henrichsen, Henrik H. ; Hansen, Ole ; Kjaer, Daniel... - p. 1-4 , 2014
Link: https://doi.org/10.1109/..
 
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14

Electrically Continuous Graphene from Single Crystal Copper..:

Buron, Jonas D. ; Pizzocchero, Filippo ; Jessen, Bjarke S....
Nano Letters.  14 (2014)  11 - p. 6348-6355 , 2014
Link: https://doi.org/10.1021/..
 
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15

Effect of B+ Flux on the Electrical Activation of Ultra-Sha..:

Yates, Bradley R ; Darby, Blake L ; Petersen, Dirch H...
ECS Transactions.  50 (2013)  9 - p. 543-549 , 2013
Link: https://doi.org/10.1149/..
 
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