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2006 Sixth IEEE Conference on Nanotechnology ,
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Expression of Concern: Accurate Resistance Modeling for Car..:
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2006 43rd ACM/IEEE Design Automation Conference ,
7
Expression of Concern: SOC-NLNA: synthesis and optimization..:
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2006 Sixth IEEE Conference on Nanotechnology ,
8
Expression of Concern: Efficient Simulation of Subwavelengt..:
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Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. ,
9
Expression of Concern: Efficient analytical modeling techni..:
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ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005. ,
10
Expression of Concern: Robust automated synthesis methodolo..:
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Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design ,
11
Robust automated synthesis methodology for integrated spira..:
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Proceedings. 42nd Design Automation Conference, 2005. ,
12
Expression of Concern: Multi-level approach for integrated ..:
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48th Midwest Symposium on Circuits and Systems, 2005. ,
13