Nieuwoudt, A.
661  Ergebnisse:
Personensuche X
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1

Investigation of Real-Time Control of Finger Movements Util..:

Nieuwoudt, L. ; Fisher, C.
IEEE Sensors Journal.  23 (2023)  18 - p. 21989-21997 , 2023
 
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5

Expression of Concern: Evaluating the impact of resistance ..:

Nieuwoudt, A. ; Massoud, Y.
IEEE Transactions on Electron Devices.  53 (2006)  10 - p. 2460-2466 , 2006
 
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6

Expression of Concern: Accurate Resistance Modeling for Car..:

, In: 2006 Sixth IEEE Conference on Nanotechnology,
Massoud, Y. ; Nieuwoudt, A. - p. 288-291 , 2006
 
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7

Expression of Concern: SOC-NLNA: synthesis and optimization..:

, In: 2006 43rd ACM/IEEE Design Automation Conference,
Nieuwoudt, A. ; Ragheb, T. ; Massoud, Y. - p. 879-884 , 2006
 
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8

Expression of Concern: Efficient Simulation of Subwavelengt..:

, In: 2006 Sixth IEEE Conference on Nanotechnology,
Hosseini, A. ; Nieuwoudt, A. ; Massoud, Y. - p. 437-440 , 2006
 
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9

Expression of Concern: Efficient analytical modeling techni..:

, In: Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.,
Nieuwoudt, A. ; McCorquodale, M.S. ; Borno, R.T.. - p. 281-284 , 2005
 
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10

Expression of Concern: Robust automated synthesis methodolo..:

, In: ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.,
Nieuwoudt, A. ; Massoud, Y. - p. 502,503,504,505,506,507 , 2005
 
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11

Robust automated synthesis methodology for integrated spira..:

, In: Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design,
Nieuwoudt, A. ; Massoud, Y. - p. 502-507 , 2005
 
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12

Expression of Concern: Multi-level approach for integrated ..:

, In: Proceedings. 42nd Design Automation Conference, 2005.,
Nieuwoudt, A. ; Massoud, Y. - p. 648,649,650,651 , 2005
 
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13

Expression of Concern: Efficient modeling of substrate eddy..:

, In: 48th Midwest Symposium on Circuits and Systems, 2005.,
Nieuwoudt, A. ; Massoud, Y. - p. 1823-1826 Vol. 2 , 2005
 
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14

A Poverty Profile of the Western Cape Province of South Afr..:

Oosthuizen, M J ; Nieuwoudt, L
Studies in Economics and Econometrics.  27 (2003)  3 - p. 69-90 , 2003
 
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