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Nishizawa, Shin‐ichi
280  Ergebnisse:
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1

De-Correlation and De-Bias Post-Processing Circuits for Tru..:

Zhang, Ruilin ; Zhang, Haochen ; Wang, Xingyu...
IEEE Transactions on Circuits and Systems I: Regular Papers.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Study on stress in trench structures during silicon IGBTs p..:

Cai, Bozhou ; Yuan, Jiuyang ; Miyamura, Yoshiji..
Japanese Journal of Applied Physics.  63 (2024)  3 - p. 03SP16 , 2024
Link: https://doi.org/10.35848..
 
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3

Impact of p-Gate Contact in GaN-HEMTs on Overvoltage Stress..:

Saito, Wataru ; NIshizawa, Shin-Ichi
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3590-3595 , 2024
Link: https://doi.org/10.1109/..
 
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4

A Model of Wafer Warpage for Trench Field‐Plate Power MOSFE..:

Kato, Hiroaki ; Cai, Bozhou ; Yuan, Jiuyang...
physica status solidi (a).  , 2024
Link: https://doi.org/10.1002/..
 
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5

Mechanism of gate voltage spike under digital gate control ..:

Lou, Zaiqi ; Mamee, Thatree ; Hata, Katsuhiro...
Power Electronic Devices and Components.  7 (2024)  - p. 100054 , 2024
Link: https://doi.org/10.1016/..
 
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6

Estimating of IGBT Bond Wire Lift-Off Trend Using Convoluti..:

Mamee, Thatree ; Lou, Zaiqi ; Hata, Katsuhiro...
IEEE Access.  12 (2024)  - p. 96936-96945 , 2024
Link: https://doi.org/10.1109/..
 
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7

Turn-off switching voltage surge analysis with dependence o..:

Fujimoto, Yuri ; Nishizawa, Shin-ichi ; Saito, Wataru
Japanese Journal of Applied Physics.  63 (2024)  2 - p. 02SP36 , 2024
Link: https://doi.org/10.35848..
 
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8

Numerical and experimental investigation of the effect of t..:

Suewaka, Ryota ; Saishoji, Toshiaki ; Nishizawa, Shin-ichi
Japanese Journal of Applied Physics.  63 (2024)  3 - p. 031006 , 2024
Link: https://doi.org/10.35848..
 
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9

Standard Cell Structure and Transistor Reordering for Mitig..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Nishizawa, Shinichi ; Kimura, Shinji - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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10

Overvoltage Failure Process of Cascode GaN Field Effect Tra..:

Saito, Wataru ; Nishizawa, Shin‐ichi
physica status solidi (a).  , 2024
Link: https://doi.org/10.1002/..
 
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11

SiC Materials and Devices for Future Green Society:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Nishizawa, Shin-Ichi - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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12

Paralleled SiC MOSFETs Circuit Breaker With a SiC MPS Diode..:

Takamori, Taro ; Wada, Keiji ; Saito, Wataru.
IEEE Open Journal of Power Electronics.  5 (2024)  - p. 392-401 , 2024
Link: https://doi.org/10.1109/..
 
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13

A Latch-Based Stochastic Number Generator for Stochastic Co..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Zhang, Ruilin ; Xiao, Yangjun ; Liu, Jiawei... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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14

Evaluation of thermally activated defects behaviors in nitr..:

Kajiwara, Kaoru ; Eriguchi, Kazutaka ; Fusegawa, Kazuhiro...
Japanese Journal of Applied Physics.  62 (2023)  7 - p. 075504 , 2023
Link: https://doi.org/10.35848..
 
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15

Prime Factorization Based on Multiple Quantum Annealings on..:

, In: 2023 IEEE 36th International System-on-Chip Conference (SOCC),
Guo, Xinyi ; Miao, Geguang ; Nishizawa, Shinichi. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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