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1

Technology Dependence of Stuck Bits and Single-Event Upsets..:

Söderström, Daniel ; Luza, Lucas Matana ; de Mattos, André Martins Pio...
IEEE Transactions on Nuclear Science. 70 (2023) 8 - p. 1861-1869 , 2023

Link: https://doi.org/10.1109/..

2

Failure Analysis of Atmospheric Neutron-Induced Single Even..:

Germanicus, Rosine Coq ; Niskanen, Kimmo ; Michez, Alain...
Materials Science Forum. 1062 (2022) - p. 544-548 , 2022

Link: https://doi.org/10.4028/..

3

Comparison of the Total Ionizing Dose Sensitivity of a Syst..:

Rajkowski, Tomasz ; Saigné, Frédéric ; Niskanen, Kimmo...
Electronics. 10 (2021) 11 - p. 1235 , 2021

Link: https://doi.org/10.3390/..

4

Radiation Hardness Assurance Through System-Level Testing: ..:

Coronetti, Andrea ; Alia, Ruben Garcia ; Budroweit, Jan...
IEEE Transactions on Nuclear Science. 68 (2021) 5 - p. 958-969 , 2021

Link: https://doi.org/10.1109/..

5

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483. , 2023

Link: https://hal.science/hal-..

6

Technology Dependence of Stuck Bits and Single-Event Upsets..:

Söderström, Daniel ; Luza, Lucas Matana ; de Mattos, André Martins Pio...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3295435. , 2023

Link: https://hal.science/hal-..

7

Technology Dependence of Stuck Bits and Single Event Upsets..:

Söderström, Daniel ; Matana Luza, Lucas ; Martins Pio De Mattos, André...
IEEE Transactions on Nuclear Science. , 2023

Link: http://urn.fi/URN:NBN:fi..

8

Technology Dependence of Stuck Bits and Single-Event Upsets..:

Söderström, Daniel ; Luza, Lucas Matana ; de Mattos, André Martins Pio...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3295435. , 2023

Link: https://hal.science/hal-..

9

Proton Irradiation-Induced Reliability Degradation of SiC P..:

Niskanen, Kimmo ; Kettunen, Heikki ; Söderström, Daniel...
IEEE Transactions on Nuclear Science. , 2023

Link: http://urn.fi/URN:NBN:fi..

10

AFM-sMIM analysis of the recombination enhancing layer for ..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Niskanen, Kimmo..
hal-04313957. , 2023

Link: https://hal.science/hal-..

11

Technology Dependence of Stuck Bits and Single-Event Upsets..:

Söderström, Daniel ; Luza, Lucas Matana ; de Mattos, André Martins Pio...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3295435. , 2023

Link: https://hal.science/hal-..

12

AFM-sMIM analysis of the recombination enhancing layer for ..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Niskanen, Kimmo..
hal-04313957. , 2023

Link: https://hal.science/hal-..

13

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483. , 2023

Link: https://hal.science/hal-..

14

AFM-sMIM analysis of the recombination enhancing layer for ..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Niskanen, Kimmo..
hal-04313957. , 2023

Link: https://hal.science/hal-..

15

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483. , 2023

Link: https://hal.science/hal-..

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