Nogita, Kanta
4  Ergebnisse:
Personensuche X
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1

High Density RDL Interconnection of Die to Die using Chip-F..:

, In: 2023 International Conference on Electronics Packaging (ICEP),
 
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2

Development of High Reliability Process for Fine Cu Wiring ..:

Kanayama, Taka ; Sueyoshi, Haruki ; Nogita, Kanta.
Transactions of The Japan Institute of Electronics Packaging.  13 (2020)  0 - p. E20-005-1-E20-005-3 , 2020
 
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4

Evaluation of Residual Stress and Warpage of Device Embedde..:

Han, Younggun ; Horiuchi, Osamu ; Hayashi, Shigehiro...
Transactions of The Japan Institute of Electronics Packaging.  8 (2015)  1 - p. 81-94 , 2015
 
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