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2024 IEEE International Reliability Physics Symposium (IRPS) ,
10
A Comprehensive Study of Read-After-Write-Delay for Ferroel..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
11
Drain Current Degradation Induced by Charge Trapping/De-Tra..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
13