Noh, Youngji
17  Ergebnisse:
Personensuche X
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1

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024
 
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2

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
 
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3

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
 
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8

Long‐term surveillance of bat coronaviruses in Korea: Diver..:

Lo, Van Thi ; Yoon, Sun‐Woo ; Noh, Ji Yeong...
Transboundary and Emerging Diseases.  67 (2020)  6 - p. 2839-2848 , 2020
 
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14

Development and Field Application of a Passive Sampler for ..:

Seung-Hwan Cha ; Young-Ji Han ; Ji-Won Jeon...
http://www.asianjae.org/_common/do.php?a=full&b=11&bidx=1922&aidx=23534.  , 2020
 
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