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Nolmans, Philip
3  Ergebnisse:
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Characterization and Reliability Study of an Al-Doped HfO₂-..:

Chery, Emmanuel ; Croes, Kristof ; Nolmans, Philip.
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3845-3851 , 2024
Link: https://doi.org/10.1109/..
 
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84%-Efficiency Fully Integrated Voltage Regulator for Compu..:

Lin, Hesheng ; Velenis, Dimitrios ; Nolmans, Philip...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  30 (2022)  5 - p. 661-665 , 2022
Link: https://doi.org/10.1109/..
 
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Impact of via density and passivation thickness on the mech..:

Ključar, Luka ; González, Mario ; Croes, Kristof...
Microelectronics Reliability.  79 (2017)  - p. 297-305 , 2017
Link: https://doi.org/10.1016/..
 
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