Nuns, T.
54  Ergebnisse:
Personensuche X
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2

Influence of LDD spacers on total ionizing dose response of..:

Cussac, G. ; Nuns, T. ; Ducret, S...
Microelectronics Reliability.  135 (2022)  - p. 114603 , 2022
 
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4

Total Ionizing Dose Hardness Enhancement at Room Temperatur..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Cussac, G. ; Artola, L. ; Nuns, T.. - p. 1-8 , 2020
 
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5

About the scatter of displacement damage and its consequenc..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Inquimbert, C. ; Nuns, T. - p. 1-9 , 2018
 
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6

Experimental Study of the NIEL Scaling for Silicon Devices:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Nuns, T. ; Inguimbert, C. ; Soonckindt, S.... - p. 1-8 , 2018
 
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