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2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
4
Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
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49th European Conference on Optical Communications (ECOC 2023) ,
10
Accelerated dark current degradation study of monolithicall..:
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2023 International Electron Devices Meeting (IEDM) ,
11
High Performance mm Wave AlN/GaN MISHEMTs on 200 mm Si Subs..:
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2023 International Electron Devices Meeting (IEDM) ,
13