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O. E. Lubenchenko
23  Ergebnisse:
Personensuche X
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1

New Standards of Quality Management in Audit. The Risk-Base..:

Lubenchenko, O. E. ; Shulha, S. V. ; Korinko, M. D.
Statistics of Ukraine.  96 (2022)  1 - p. 117-126 , 2022
Link: https://doi.org/10.31767..
 
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2

Міжнародні стандарти фінансової звітності та знецінення фін..:

Lubenchenko, O.E. ; Pivniova, О. M.
Scientific Bulletin of the National Academy of Statistics, Accounting and Audit.  , 2018
Link: https://doi.org/10.31767..
 
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3

New Standards of Quality Management in Audit. The Risk-Base..:

O. E. Lubenchenko ; S. V. Shulha ; M. D. Korinko
https://su-journal.com.ua/index.php/journal/article/view/369.  , 2022
Link: https://doi.org/10.31767..
 
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4

Organizational Principles of the Financial Reporting Audit ..:

O. E. Lubenchenko ; М. М. Vasiliuk
https://su-journal.com.ua/index.php/journal/article/view/247.  , 2019
Link: https://doi.org/10.31767..
 
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5

The Internal Standard "The Policy and Procedure of the Syst..:

O. E. Lubenchenko
https://su-journal.com.ua/index.php/journal/article/view/261.  , 2019
Link: https://doi.org/10.31767..
 
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6

Міжнародні стандарти фінансової звітності та знецінення фін..:

О. M. Pivniova ; O.E. Lubenchenko
https://nasoa-journal.com.ua/index.php/journal/article/view/134.  , 2018
Link: https://doi.org/10.31767..
 
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7

Using the International Standard of Auditing 315 "Identifyi..:

LUBENCHENKO, O. ; KORINKO, M.
Scientific Bulletin of the National Academy of Statistics, Accounting and Audit.  , 2021
Link: https://doi.org/10.31767..
 
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8

Numerical Simulation of Photoelectric Emission from a Nano-..:

Lukiantsev, D. S. ; Lubenchenko, A. V. ; Ivanov, D. A....
Physics of Atomic Nuclei.  86 (2023)  10 - p. 2344-2351 , 2023
Link: https://doi.org/10.1134/..
 
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9

Controlled Ultra-Thin Suboxide Films Generation in Metal-Ox..:

Lubenchenko, A V ; Lukyantsev, D S ; Pavolotsky, A B...
Journal of Physics: Conference Series.  1695 (2020)  1 - p. 012025 , 2020
Link: https://doi.org/10.1088/..
 
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10

ThinFilmsAnalysisMPEI – Software for XPS Analysis of Multil..:

Lubenchenko, A V ; Lubenchenko, O I ; Ivanov, D A.
Journal of Physics: Conference Series.  1683 (2020)  3 - p. 032014 , 2020
Link: https://doi.org/10.1088/..
 
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11

Interface Layers of Niobium Nitride Thin Films:

Lubenchenko, A V ; Iachuk, V A ; Krause, S...
Journal of Physics: Conference Series.  1410 (2019)  1 - p. 012124 , 2019
Link: https://doi.org/10.1088/..
 
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12

Non-destructive chemical and phase layer profiling of multi..:

Lubenchenko, A V ; Ivanov, D A ; Lubenchenko, O I...
Journal of Physics: Conference Series.  1370 (2019)  1 - p. 012048 , 2019
Link: https://doi.org/10.1088/..
 
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13

Formation of inelastic scattered background photoelectrons,..:

Lubenchenko, A V ; Ivanov, D A ; Lubenchenko, O I.
Journal of Physics: Conference Series.  1370 (2019)  1 - p. 012049 , 2019
Link: https://doi.org/10.1088/..
 
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14

Air-Oxidation of Nb Nano-Films:

Lubenchenko, A. V. ; Batrakov, A. A. ; Ivanov, D. A....
Semiconductors.  52 (2018)  5 - p. 678-682 , 2018
Link: https://doi.org/10.1134/..
 
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15

XPS Study of Niobium and Niobium-Nitride Nanofilms:

Lubenchenko, A. V. ; Batrakov, A. A. ; Shurkaeva, I. V....
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.  12 (2018)  4 - p. 692-700 , 2018
Link: https://doi.org/10.1134/..
 
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