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Oboňa, J. Vincenc
24  Ergebnisse:
Personensuche X
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1

Pulse-analysis-pulse investigation of femtosecond laser-ind..:

Oboňa, J. Vincenc ; Skolski, J. Z. P. ; Römer, G. R. B. E..
Optics Express.  22 (2014)  8 - p. 9254 , 2014
Link: https://doi.org/10.1364/..
 
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2

Modeling laser-induced periodic surface structures: Finite-..:

Skolski, J. Z. P. ; Römer, G. R. B. E. ; Vincenc Obona, J..
Journal of Applied Physics.  115 (2014)  10 - p. , 2014
Link: https://doi.org/10.1063/..
 
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3

Finite-difference Time-domain Modeling of Laser-induced Per..:

Römer, G.R.B.E. ; Skolski, J.Z.P. ; Oboňa, J. Vincenc.
Physics Procedia.  56 (2014)  - p. 1325-1333 , 2014
Link: https://doi.org/10.1016/..
 
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4

Modification of Cu surface with picosecond laser pulses:

Vincenc Oboňa, J. ; Ocelík, V. ; Rao, J.C....
Applied Surface Science.  303 (2014)  - p. 118-124 , 2014
Link: https://doi.org/10.1016/..
 
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5

On the surface topography of ultrashort laser pulse treated..:

Vincenc Obona, J. ; Ocelík, V. ; Skolski, J.Z.P....
Applied Surface Science.  258 (2011)  4 - p. 1555-1560 , 2011
Link: https://doi.org/10.1016/..
 
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6

Creation of stable nanoconstrictions in metallic thin films..:

Vincenc Oboňa, J. ; de Teresa, J.M. ; Córdoba, R...
Microelectronic Engineering.  86 (2009)  4-6 - p. 639-641 , 2009
Link: https://doi.org/10.1016/..
 
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7

C60 films as etching masks for creation of micrometer and s..:

Vincenc Oboňa, J. ; Chromik, Š. ; Španková, M...
Physica C: Superconductivity and its Applications.  435 (2006)  1-2 - p. 37-40 , 2006
Link: https://doi.org/10.1016/..
 
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8

Mitigating Curtaining Artifacts During Ga FIB TEM Lamella P..:

Denisyuk, Andrey ; Hrnčíř, Tomáš ; Vincenc Oboňa, Jozef...
Microscopy and Microanalysis.  23 (2017)  3 - p. 484-490 , 2017
Link: https://doi.org/10.1017/..
 
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9

In-Situ EDS Characterization of TEM Lamellae Created by Xe ..:

Hrnčíř, Tomáš ; Lang, Christian ; Vincenc Oboňa, Jozef.
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1405-1406 , 2015
Link: https://doi.org/10.1017/..
 
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10

Speeding up large-scale failure analysis of semiconductor d..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tucek, Marek ; Blando, Rodrigo ; Vana, Rostislav.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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11

Xe Plasma vs Gallium FIB Delayering:

Sharang, S. ; Anzalone, Paul ; Obona, Jozef Vincenc
Microscopy and Microanalysis.  25 (2019)  S2 - p. 904-905 , 2019
Link: https://doi.org/10.1017/..
 
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12

In-depth Analysis of 10 nm Exynos Processor using Micro CT ..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Sharang, S ; Dluhos, Jiri ; Kalasova, Dominika... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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13

Xe plasma FIB Delayering of IC based on 14 nm node technolo..:

Oboňa, Jozef Vincenc ; Hrnčíř, Tomáš ; Sharang..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 56-57 , 2016
Link: https://doi.org/10.1017/..
 
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14

A comparison of three different notching ions for small-sca..:

Best, James P. ; Zechner, Johannes ; Shorubalko, Ivan...
Scripta Materialia.  112 (2016)  - p. 71-74 , 2016
Link: https://doi.org/10.1016/..
 
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15

Curtaining-Free Top-Down TEM Lamella Preparation from a Cut..:

Denisyuk, Andrey ; Hrnčíř, Tomáš ; Oboňa, Jozef Vincenc..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 196-197 , 2016
Link: https://doi.org/10.1017/..
 
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