Ohba, T.
504  Ergebnisse:
Personensuche X
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3

Development of Raman Spectroscopy for Defect Analysis in Si..:

, In: 2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Myalitsin, A. ; Yoda, T. ; Ohba, T. - p. 86-87 , 2023
 
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4

Study of High-Speed Bonding Process with Thin Adhesive for ..:

, In: 2023 International Conference on Electronics Packaging (ICEP),
Kudo, T. ; Satake, Y. ; Funaki, T.... - p. 103-104 , 2023
 
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5

Non-destructive measurement of the beryllium thickness of t..:

Sato, M. ; Kurihara, T. ; Naito, F....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1052 (2023)  - p. 168291 , 2023
 
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6

Raman Spectroscopy and Hyperspectral Imaging for Wafer-On-W..:

, In: 2022 17th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Myalitsin, A. ; Chen, Z.-W. ; Araki, N.... - p. 1-4 , 2022
 
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7

Impact of Backside Defects on Device Characteristics of Ult..:

, In: 2022 International Conference on Electronics Packaging (ICEP),
Chen, Z. ; Araki, N. ; Kim, Y.... - p. 141-142 , 2022
 
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8

Deformation Characteristics of Micron-level Thin Adhesive L..:

, In: 2022 International Conference on Electronics Packaging (ICEP),
Kudo, T. ; Funaki, T. ; Araki, N... - p. 31-32 , 2022
 
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9

Retraction notice to "Intelligent cooling water control for..:

Fang, Z. ; Sato, M. ; Futatsukawa, K....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  994 (2021)  - p. 165134 , 2021
 
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10

Development of an application tool to support returnees in ..:

Ohba, T. ; Goto, A. ; Nakano, H....
Annals of the ICRP.  50 (2021)  1_suppl - p. 187-193 , 2021
 
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12

Chitosan encapsulated ZnO nanoparticles for labeling applic..:

Senthilkumar, O ; Senthilkumar, K ; Revathi, C...
Journal of Physics: Conference Series.  1706 (2020)  1 - p. 012016 , 2020
 
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15

The effect of different organic solvents and anion salts on..:

Khan, M. S. ; Karatrantos, A. V. ; Ohba, T..
Physical Chemistry Chemical Physics.  21 (2019)  41 - p. 22722-22731 , 2019
 
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