E-LIB Suche - Ergebnisse für: Ohdaira, Keisuke

1

Tungsten-Doped ZnO as an Electron Transport Layer for Perov..:

Gantumur, Munkhtuul ; Hossain, Mohammad Ismail ; Shahiduzzaman, Md....
ACS Applied Materials & Interfaces. 16 (2024) 28 - p. 36255-36271 , 2024

Link: https://doi.org/10.1021/..

2

High Passivation Performance of Cat-CVD i-a-Si:H Derived fr..:

Ohashi, Ryota ; Kutsukake, Kentaro ; Thi Cam Tu, Huynh..
ACS Applied Materials & Interfaces. 16 (2024) 7 - p. 9428-9435 , 2024

Link: https://doi.org/10.1021/..

3

Ultrathin Al-doped SiOxpassivating hole-selective contacts ..:

Nakajima, Hiroki ; Thi Cam Tu, Huynh ; Ohdaira, Keisuke
Japanese Journal of Applied Physics. 62 (2023) SK - p. SK1040 , 2023

Link: https://doi.org/10.35848..

4

Encapsulation-free crystalline silicon photovoltaic modules..:

Imajo, Nobuhito ; Yamakawa, Yo ; Takahashi, Hiroaki..
Japanese Journal of Applied Physics. 62 (2023) SK - p. SK1025 , 2023

Link: https://doi.org/10.35848..

5

Delay of the potential-induced degradation of n-type crysta..:

Wu, Deqin ; Tu, Huynh Thi Cam ; Ohdaira, Keisuke
Japanese Journal of Applied Physics. 63 (2023) 2 - p. 02SP06 , 2023

Link: https://doi.org/10.35848..

6

Potential-induced degradation of n-type front-emitter cryst..:

Ohdaira, Keisuke ; Akitomi, Minoru ; Chiba, Yasuo.
Solar Energy Materials and Solar Cells. 249 (2023) - p. 112038 , 2023

Link: https://doi.org/10.1016/..

7

Long-term stability of low-temperature deposited Cat-CVD Si..:

Thi Cam Tu, Huynh ; Ohdaira, Keisuke
Japanese Journal of Applied Physics. 63 (2023) 1 - p. 01SP25 , 2023

Link: https://doi.org/10.35848..

8

Potential-induced degradation of encapsulant-less p-type cr..:

Shimpo, Shuntaro ; Thi Cam Tu, Huynh ; Ohdaira, Keisuke
Japanese Journal of Applied Physics. 62 (2023) SK - p. SK1039 , 2023

Link: https://doi.org/10.35848..

9

Second-stage potential-induced degradation of n-type front-..:

Ohdaira, Keisuke ; Komatsu, Yutaka ; Yamaguchi, Seira.
Japanese Journal of Applied Physics. 62 (2023) SK - p. SK1033 , 2023

Link: https://doi.org/10.35848..

10

P‐134: Detection of Ion Impurities in Organic Thin Films by..:

Iwata, Takuro ; Inoue, Masaru ; Oyabu, Noriaki..
SID Symposium Digest of Technical Papers. 53 (2022) 1 - p. 1513-1516 , 2022

Link: https://doi.org/10.1002/..

11

Cat-CVD SiNxas a gas barrier for application to perovskite ..:

Tu, Huynh Thi Cam ; Shimazaki, Ai ; Kaneko, Ryuji..
Japanese Journal of Applied Physics. 61 (2022) 12 - p. 121002 , 2022

Link: https://doi.org/10.35848..

12

Enhancement of ferroelectricity in sputtered HZO thin films..:

Mohit, Mohit ; Wen, Yuli ; Hara, Yuki...
Japanese Journal of Applied Physics. , 2022

Link: https://doi.org/10.35848..

13

Carrier lifetime measurement of perovskite films by differe..:

Ohdaira, Keisuke ; Thi Cam Tu, Huynh ; Shimazaki, Ai...
Japanese Journal of Applied Physics. 61 (2022) 6 - p. 068001 , 2022

Link: https://doi.org/10.35848..

14

Mechanistic Understanding of Polarization‐Type Potential‐In..:

Yamaguchi, Seira ; Masuda, Atsushi ; Marumoto, Kazuhiro.
Advanced Energy and Sustainability Research. 4 (2022) 4 - p. , 2022

Link: https://doi.org/10.1002/..

15

Hole‐Selective Ultrathin Al‐Doped SiOx Passivation Layer Fo..:

Nakajima, Hiroki ; Tu, Huynh Thi Cam ; Ohdaira, Keisuke
physica status solidi (RRL) – Rapid Research Letters. 16 (2022) 7 - p. , 2022

Link: https://doi.org/10.1002/..