E-LIB Suche - Ergebnisse für: Ohkura, Makoto

1

62.1: Invited Paper: Fluorinated Compounds Emission Reducti..:

Ohkura, Makoto ; Luo, Fan ; Lee, Eui‐Guen...
SID Symposium Digest of Technical Papers. 43 (2012) 1 - p. 838-841 , 2012

2

Temperature Dependence of Performance and Hot-Carrier Immun..:

Matsumura, Mieko ; Toyota, Yoshiaki ; Hatano, Mutsuko.
Japanese Journal of Applied Physics. 49 (2010) 8R - p. 084101 , 2010

Link: https://doi.org/10.1143/..

3

Post-Annealing Effects on a Laterally Grown Polycrystalline..:

Tai, Mitsuharu ; Sato, Takeshi ; Matsumura, Mieko..
Japanese Journal of Applied Physics. 47 (2008) 8R - p. 6217 , 2008

Link: https://doi.org/10.1143/..

4

34.5L: Late‐News Paper: Low Cost Retarder‐less Transflectiv..:

Ochiai, Takahiro ; Sasaki, Tohru ; Miyazawa, Toshio...
SID Symposium Digest of Technical Papers. 38 (2007) 1 - p. 1258-1261 , 2007

Link: https://doi.org/10.1889/..

5

P‐9: Unified Model and Prediction Technique for On‐Current ..:

Kawamura, Tetsufumi ; Matsumura, Mieko ; Hatano, Mutsuko...
SID Symposium Digest of Technical Papers. 38 (2007) 1 - p. 202-205 , 2007

Link: https://doi.org/10.1889/..

6

Device Performance and Reliability of Fully Developed SOI T..:

Matsumura, Mieko ; Hatano, Mutsuko ; Hamamura, Hirotaka...
ECS Transactions. 8 (2007) 1 - p. 33-38 , 2007

Link: https://doi.org/10.1149/..

7

High Reliability and Performance Poly-Si TFTs for System in..:

Hatano, Mutsuko ; Matsumura, Mieko ; Toyota, Yoshiaki...
ECS Transactions. 3 (2006) 8 - p. 35-41 , 2006

Link: https://doi.org/10.1149/..

8

P‐6: A Design Robust Against Hot‐carrier Stress for Low‐tem..:

Shiba, Takeo ; Itoga, Toshihiko ; Toyota, Yoshiaki...
SID Symposium Digest of Technical Papers. 33 (2002) 1 - p. 220-223 , 2002

Link: https://doi.org/10.1889/..

9

12.4: Late‐News Paper: Selectively Enlarging Laser Crystall..:

Hatano, Mutsuko ; Shiba, Takeo ; Ohkura, Makoto
SID Symposium Digest of Technical Papers. 33 (2002) 1 - p. 158-161 , 2002

Link: https://doi.org/10.1889/..

10

12.1: 45°C Low‐Temperature Poly‐Si TFT Fabrication Process ..:

Ohkura, Makoto ; Shimomura, Shigeo ; Miyazawa, Toshio..
SID Symposium Digest of Technical Papers. 33 (2002) 1 - p. 146-149 , 2002

Link: https://doi.org/10.1889/..

11

New Technique to Determine Gettering Efficiency of Heavy Me..:

Itoga, Toshihiko ; Hozawa, Kazuyuki ; Takeda, Kazuo..
Japanese Journal of Applied Physics. 40 (2001) 4R - p. 2105 , 2001

Link: https://doi.org/10.1143/..

12

X-ray crystal truncation rod scattering analysis of reactiv..:

Isomae, Seiichi ; Ohkura, Makoto ; Maki, Michiyoshi.
Journal of Applied Physics. 84 (1998) 10 - p. 5482-5486 , 1998

Link: https://doi.org/10.1063/..

13

The Increase of the Native Oxide Thickness on H-Terminated ..:

Itoga, Toshihiko ; Kojima, Hisao ; Jiro Yugami, Jiro Yugami.
Japanese Journal of Applied Physics. 36 (1997) 3S - p. 1578 , 1997

Link: https://doi.org/10.1143/..

14

Degradation of n+/p Junction Characteristics by Aluminum Co..:

Itoga, Toshihiko ; Kojima, Hisao ; Atsushi Hiraiwa, Atsushi Hiraiwa.
Japanese Journal of Applied Physics. 36 (1997) 7R - p. 4431 , 1997

Link: https://doi.org/10.1143/..

15

Picosecond Time-Resolved Spectroscopy of the Photoluminesce..:

Norio Akiyama, Norio Akiyama ; Katsuhiro Ishii, Katsuhiro Ishii ; Makoto Ohkura, Makoto Ohkura..
Japanese Journal of Applied Physics. 34 (1995) 12B - p. L1647 , 1995

Link: https://doi.org/10.1143/..