Ohkura, Y
195  Ergebnisse:
Personensuche X
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2

Development of High-Resolution Transmission Electron Micros..:

Motoki, S. ; Kaneko, T. ; Iijima, H....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 826-827 , 2017
 
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3

Development of Amorphous Carbon Thin Film Phase Plate:

Konyuba, Y. ; Iijima, H. ; Hosogi, N....
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1573-1574 , 2015
 
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4

High Throughput Fabrication Process of a Zernike Phase Plat:

Konyuba, Y. ; Iijima, H. ; Abe, Y...
Microscopy and Microanalysis.  20 (2014)  S3 - p. 222-223 , 2014
 
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5

Histopathologic findings in patients with idiopathic megaco..:

Ohkubo, H. ; Masaki, T. ; Matsuhashi, N....
Neurogastroenterology & Motility.  26 (2014)  4 - p. 571-580 , 2014
 
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6

Mechanical properties of AC4CH alloys produced by heated mo..:

Okayasu, M ; Takeuchi, S ; Ohkura, Y.
International Journal of Cast Metals Research.  26 (2013)  3 - p. 160-167 , 2013
 
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7

Aberration Corrected Zernike Phase Contrast TEM:

Iijima, H. ; Motoki, S. ; Hosokawa, F..
Microscopy and Microanalysis.  18 (2012)  S2 - p. 492-493 , 2012
 
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8

Compositional change of NaCl particles under electron beam ..:

Ohnishi, I. ; Shibuya, K. ; Tachibana, K....
Microscopy and Microanalysis.  18 (2012)  S2 - p. 1052-1053 , 2012
 
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9

A study of the mechanical properties of an Al–Si–Cu alloy (..:

Okayasu, M. ; Ohkura, Y. ; Takeuchi, S....
Materials Science and Engineering: A.  543 (2012)  - p. 185-192 , 2012
 
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10

A New Electron Microscope with an Easy Operation System for..:

Kawai, S ; Matsushita, M ; Tanaka, K...
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1198-1199 , 2011
 
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11

Effect of fluorine contamination on barrier metal oxidation:

Ozaki, S. ; Nakata, Y. ; Kobayashi, Y....
Microelectronic Engineering.  87 (2010)  3 - p. 370-372 , 2010
 
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12

TEM and STEM Tomography for thick polymer sample:

Kaneko, T ; Motoki, S ; Aoyama, Y...
Microscopy and Microanalysis.  15 (2009)  S2 - p. 630-631 , 2009
 
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13

Remote Teaching for Electron Microscopy:

Isabell, TC ; Ohkura, Y ; Kobayashi, T.
Microscopy and Microanalysis.  14 (2008)  S2 - p. 872-873 , 2008
 
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14

High manufacturability Cu multilevel interconnects featurin..:

Sugiura, I. ; Misawa, N. ; Otsuka, S....
Microelectronic Engineering.  82 (2005)  3-4 - p. 380-386 , 2005
 
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15

A Newly Developed PC controlled 200kV FE-TEM:

Okamoto, K. ; Ohkura, Y. ; Naruse, M....
Microscopy and Microanalysis.  9 (2003)  S02 - p. 1272-1273 , 2003
 
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