Ohlmann, J.
1816  Ergebnisse:
Personensuche X
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2

Ultrafast GaAs MOVPE growth for power electronics:

Lackner, D. ; Urban, T. ; Lang, R....
Journal of Crystal Growth.  613 (2023)  - p. 127201 , 2023
 
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6

Hall characterization of epitaxial GaSb and AlGaAsSb layers..:

Predan, F. ; Ohlmann, J. ; Mrabet, S...
Journal of Crystal Growth.  496-497 (2018)  - p. 36-42 , 2018
 
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9

Growth of (BGa)As, (BGa)P, (BGa)(AsP) and (BGaIn)P by MOVPE:

Sommer, N. ; Buss, R. ; Ohlmann, J....
Journal of Crystal Growth.  370 (2013)  - p. 191-196 , 2013
 
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11

Entwicklung des menschlichen Auges:

Tamm, E.R. ; Ohlmann, A.
Der Ophthalmologe.  109 (2012)  9 - p. 911-928 , 2012
 
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12

Quantitative HAADF-studies of GaP/Si-interfaces:

Haas, B. ; Beyer, A. ; Ohlmann, J...
Microscopy and Microanalysis.  18 (2012)  S2 - p. 352-353 , 2012
 
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13

Investigation of the GaP/Si Interface by High-Resolution Sc..:

Beyer, A ; Ohlmann, J ; Luysberg, M.
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1390-1391 , 2011
 
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15

Photoluminescence properties of sol–gel derived SiO2 layers..:

Švrček, V ; Pelant, I ; Rehspringer, J.-L...
Materials Science and Engineering: C.  19 (2002)  1-2 - p. 233-236 , 2002
 
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