Ohta, Taisuke
120  Ergebnisse:
Personensuche X
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1

Direct Characterization of Buried Interfaces in 2D/3D Heter..:

Smyth, Christopher M. ; Cain, John M. ; Boehm, Alex...
ACS Applied Materials & Interfaces.  16 (2024)  2 - p. 2847-2860 , 2024
 
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Ex Situ Photoelectron Emission Microscopy of Polycrystallin..:

Sharma, Peter A. ; Ohta, Taisuke ; Brumbach, Michael T...
ACS Applied Materials & Interfaces.  13 (2021)  15 - p. 18218-18226 , 2021
 
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10

K-means-driven Gaussian Process data collection for angle-r..:

Melton, Charles N ; Noack, Marcus M ; Ohta, Taisuke...
Machine Learning: Science and Technology.  1 (2020)  4 - p. 045015 , 2020
 
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11

Employing Nanoscale Surface Characterizations in a Field Em..:

, In: 2020 IEEE International Conference on Plasma Science (ICOPS),
 
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Local Electronic Structure Changes in Polycrystalline CdTe ..:

Berg, Morgann ; Kephart, Jason M. ; Munshi, Amit...
ACS Applied Materials & Interfaces.  10 (2018)  11 - p. 9817-9822 , 2018
 
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