Okunishi, E.
71  Ergebnisse:
Personensuche X
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1

Atomic-scale chemical mapping of copper dopants in Bi2Te2.7..:

Kim, Y.-M. ; Lee, K.H. ; Fu, L....
Materials Today Physics.  17 (2021)  - p. 100347 , 2021
 
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2

Practical Measurement of X-ray Detection Performance of Lar..:

Watanabe, M. ; Sasaki, T. ; Jimbo, Y...
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1223-1224 , 2015
 
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3

Atomic-scale Dual-EELS/EDX Spectroscopy Applied to Rare-ear..:

Phillips, P.J. ; Longo, P. ; Okunishi, E..
Microscopy and Microanalysis.  21 (2015)  S3 - p. 495-496 , 2015
 
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4

Development of a high-efficiency DF-STEM detector:

Kaneko, T ; Saitow, A ; Fujino, T..
Journal of Physics: Conference Series.  522 (2014)  - p. 012050 , 2014
 
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5

Resolving 45 pm with 300 kV Aberration Corrected STEM:

Sawada, H. ; Shimura, N. ; Satoh, K....
Microscopy and Microanalysis.  20 (2014)  S3 - p. 124-125 , 2014
 
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6

A dissociation mechanism for the [a+c] dislocation in GaN:

Nellist, P D ; Hirsch, P B ; Rhode, S...
Journal of Physics: Conference Series.  522 (2014)  - p. 012037 , 2014
 
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8

HAADF-STEM studies of athermal and isothermal ω-phases in β..:

Okunishi, E. ; Kawai, T. ; Mitsuhara, M....
Journal of Alloys and Compounds.  577 (2013)  - p. S713-S716 , 2013
 
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11

The dissociation of the [a + c] dislocation in GaN:

Hirsch, P.B. ; Lozano, J.G. ; Rhode, S....
Philosophical Magazine.  93 (2013)  28-30 - p. 3925-3938 , 2013
 
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12

Ultra High Energy Resolution EELS Map Employing an Aberrati..:

Mukai, M. ; Okunishi, E. ; Ashino, M....
Microscopy and Microanalysis.  19 (2013)  S2 - p. 1126-1127 , 2013
 
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14

Quantitative Analysis of Atomic-Resolution X-ray Maps in an..:

Watanabe, M. ; Yasuhara, A. ; Okunishi, E.
Microscopy and Microanalysis.  18 (2012)  S2 - p. 974-975 , 2012
 
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