E-LIB Suche - Ergebnisse für: Olikhovskii, Stepan I

1

X-ray dynamical diffraction by quasi-monolayer graphene:

Skakunova, Olena S. ; Olikhovskii, Stepan I. ; Radchenko, Taras M....
Scientific Reports. 13 (2023) 1 - p. , 2023

2

X-ray dynamical diffraction by quasi-monolayer graphene:

Skakunova, Olena S ; Olikhovskii, Stepan I ; Radchenko, Taras M...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10518303/. , 2023

Link: http://www.ncbi.nlm.nih...

3

X-ray dynamical diffraction by quasi-monolayer graphene:

Olena S. Skakunova ; Stepan I. Olikhovskii ; Taras M. Radchenko...
https://doi.org/10.1038/s41598-023-43269-6. , 2023

Link: https://doi.org/10.1038/..

4

Physica status solidi / A

Volume 108, Number 1, July 1988 Physica status solidi / A ; Volume 108, Number 1

Abajs, S. ; Akramov, A. Sh. ; Aksenov, I. A.... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

5

Physica status solidi

Volume 87, Number 2: February 16 Physica status solidi ; Volume 87, Number 2, A

Akonov, D. A ; Akselrod, M. S ; Amelinckx, S... - Reprint 2021 . , [2022]

Link: https://doi.org/10.1515/..

6

Dynamical X‐ray diffraction theory: Characterization of def..:

Olikhovskii, S. I. ; Molodkin, V. B. ; Skakunova, O. S....
physica status solidi (b). 254 (2017) 7 - p. , 2017

Link: https://doi.org/10.1002/..

7

Combined multiparametric X-ray diffraction diagnostics of m..:

Kislovskii, E. N. ; Molodkin, V. B. ; Olikhovskii, S. I....
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 7 (2013) 3 - p. 523-530 , 2013

Link: https://doi.org/10.1134/..

8

X‐ray diffraction characterization of microdefects in silic..:

Molodkin, V. B. ; Olikhovskii, S. I. ; Len, E. G....
physica status solidi (a). 208 (2011) 11 - p. 2552-2557 , 2011

Link: https://doi.org/10.1002/..

9

Dynamical X‐ray diffractometry of the defect structure of g..:

Pylypiv, V. M. ; Vladimirova, T. P. ; Fodchuk, I. M....
physica status solidi (a). 208 (2011) 11 - p. 2558-2562 , 2011

Link: https://doi.org/10.1002/..

10

Sensitivity of triple-crystal X-ray diffractometers to micr..:

Molodkin, V. B. ; Olikhovskii, S. I. ; Len, E. G....
physica status solidi (a). 206 (2009) 8 - p. 1761-1765 , 2009

Link: https://doi.org/10.1002/..

11

X-ray diffuse scattering effects from Coulomb-type defects ..:

Olikhovskii, S. I. ; Molodkin, V. B. ; Skakunova, E. S...
physica status solidi (a). 206 (2009) 8 - p. 1790-1794 , 2009

Link: https://doi.org/10.1002/..

12

Dynamical theoretical model of the high-resolution double-c..:

Molodkin, V. B. ; Olikhovskii, S. I. ; Kislovskii, E. N....
Physical Review B. 78 (2008) 22 - p. , 2008

Link: https://doi.org/10.1103/..

13

Dynamical theory of X‐ray diffraction by multilayered struc..:

Molodkin, V. B. ; Olikhovskii, S. I. ; Kislovskii, E. N....
physica status solidi (a). 204 (2007) 8 - p. 2606-2612 , 2007

Link: https://doi.org/10.1002/..

14

Combined double‐ and triple‐crystal X‐ray diffractometry wi..:

Shpak, A. P. ; Molodkin, V. B. ; Olikhovskii, S. I....
physica status solidi (a). 204 (2007) 8 - p. 2651-2656 , 2007

Link: https://doi.org/10.1002/..

15

Evolution of the microdefect structure in silicon on isothe..:

Kyslovskyy, Ye. M. ; Vladimirova, T. P. ; Olikhovskii, S. I....
physica status solidi (a). 204 (2007) 8 - p. 2591-2597 , 2007

Link: https://doi.org/10.1002/..