Orchowski, A.
251  Ergebnisse:
Personensuche X
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2

Results on 20kV Spectroscopy with Monochromation and In-Col..:

Pokrant, S ; Orchowski, A ; Benner, G..
Microscopy and Microanalysis.  17 (2011)  S2 - p. 1186-1187 , 2011
 
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4

Aberration-Correction in a Monochromated and Energy Filtere..:

Bell, DC ; Meyer, S ; Orchowski, A..
Microscopy and Microanalysis.  15 (2009)  S2 - p. 1490-1491 , 2009
 
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5

Sub-Ångstrom and sub-eV resolution with the analytical SATE:

Benner, G. ; Matijevic, M. ; Orchowski, A....
Microscopy and Microanalysis.  10 (2004)  S03 - p. 6-7 , 2004
 
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6

Focused Ion Beam Preparation Techniques for EFTEM Analysis:

Gnauck, P. ; Zeile, U. ; Benner, G...
Microscopy and Microanalysis.  9 (2003)  S02 - p. 872-873 , 2003
 
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7

Design and First Results of SESAM:

Benner, G. ; Essers, E. ; Orchowski, A..
Microscopy and Microanalysis.  9 (2003)  S02 - p. 840-841 , 2003
 
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8

Local electrostatic potential and process-induced boron red..:

Orchowski, A. ; Rau, W.-D. ; Rücker, H....
Applied Physics Letters.  80 (2002)  14 - p. 2556-2558 , 2002
 
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9

Progress on the realization of the electron column modules ..:

Stenkamp, D. ; Kienzle, O. ; Orchowski, A....
Microelectronic Engineering.  57-58 (2001)  - p. 137-143 , 2001
 
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10

Field Emission TEM and STEM of Ultrafine Metal Particles:

Disko, M. M. ; Orchowski, A.
Microscopy and Microanalysis.  3 (1997)  S2 - p. 389-390 , 1997
 
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14

Influence of delay strategies and residual heat on in-situ ..:

Barr, Cameron ; Da Sun, Shi ; Easton, Mark...
Surface and Coatings Technology.  383 (2020)  - p. 125279 , 2020
 
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