Ortiz Gonzalez, J.
15158  Ergebnisse:
Personensuche X
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2

Benchmarking the robustness of Si and SiC MOSFETs: Unclampe..:

Ortiz Gonzalez, J. ; Deb, A. ; Bashar, E....
Microelectronics Reliability.  138 (2022)  - p. 114719 , 2022
 
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3

A Comparison of the Short Circuit Performance of 650 V SiC ..:

, In: 11th International Conference on Power Electronics, Machines and Drives (PEMD 2022),
Alatise, O. ; Erfan, B. ; Wu, R.... - p. None , 2022
 
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4

UIS performance and ruggedness of stand-alone and cascode S..:

Agbo, S.N. ; Ortiz Gonzalez, J. ; Wu, R...
Microelectronics Reliability.  114 (2020)  - p. 113803 , 2020
 
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5

Dynamic characterization of SiC and GaN devices with BTI st..:

Ortiz Gonzalez, J. ; Hedayati, M. ; Jahdi, S...
Microelectronics Reliability.  100-101 (2019)  - p. 113389 , 2019
 
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6

Robustness and reliability review of Si and SiC FET devices..:

Ortiz Gonzalez, J. ; Wu, R. ; Agbo, S.N..
Microelectronics Reliability.  100-101 (2019)  - p. 113324 , 2019
 
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7

Bias temperature instability and condition monitoring in Si..:

Ortiz Gonzalez, J. ; Alatise, O.
Microelectronics Reliability.  88-90 (2018)  - p. 557-562 , 2018
 
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8

Impact of the gate driver voltage on temperature sensitive ..:

Ortiz Gonzalez, J. ; Alatise, O.
Microelectronics Reliability.  76-77 (2017)  - p. 470-474 , 2017
 
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10

The role of air quality modelling in particulate matter man..:

Castell, N. ; Guerreiro, C. ; Denby, B.R..
Chemical Industry and Chemical Engineering Quarterly.  21 (2015)  1-2 - p. 221-227 , 2015
 
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13

A meshfree approach for analyzing strain fields near crack ..:

Gómez Gonzales, Giancarlo L. ; Camacho‐Reyes, Alonso ; Ortiz González, Julián A..
Fatigue & Fracture of Engineering Materials & Structures.  47 (2024)  6 - p. 1994-2009 , 2024
 
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