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Ota, Etsuko
81  Ergebnisse:
Personensuche X
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1

An Add-in Test Structure Chip to Unitedly Assess PVD Materi..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Yasunaga, Shun ; Misumi, Kei ; Mizushima, Ayako... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

Drop-In Test Structure to Evaluate Residual Stress in Confo..:

Usami, Naoto ; Ota, Etsuko ; Higo, Akio..
IEEE Transactions on Semiconductor Manufacturing.  34 (2021)  3 - p. 270-277 , 2021
Link: https://doi.org/10.1109/..
 
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3

Drop-in test structure chip to visualize residual stress of..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Usami, Naoto ; Ota, Etsuko ; Higo, Akio.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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4

Assessment Of Annealing Treatment For Wrinckle-Less Sio2 Me..:

, In: 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP),
Mizushima, Ayako ; Reddy, R Ranga ; Konishi, Kuniaki... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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5

Continuity assessment for supercritical-fluids-deposited (S..:

, In: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS),
Usami, Naoto ; Ota, Etsuko ; Higo, Akio.. - p. 54-57 , 2019
Link: https://doi.org/10.1109/..
 
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6

Technology transfer of supercritical fluid deposition techn..:

Ota, Etsuko ; Bourrier, David ; Usami, Naoto...
hal-04131030.  , 2023
Link: https://laas.hal.science..
 
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7

Technology transfer of supercritical fluid deposition techn..:

Ota, Etsuko ; Bourrier, David ; Usami, Naoto...
hal-04131030.  , 2023
Link: https://laas.hal.science..
 
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8

Clean room engineers' exchanges: a win/win international co..:

Bourrier, David ; Mizushima, Ayako ; Shimamoto, Naonobu...
hal-04476508.  , 2023
Link: https://laas.hal.science..
 
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9

Technology transfer of supercritical fluid deposition techn..:

Ota, Etsuko ; Bourrier, David ; Usami, Naoto...
hal-04131030.  , 2023
Link: https://laas.hal.science..
 
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10

Micron-to-Submicron Cu electroplating in view of Agile-X LS..:

Shimamoto, Naonobu ; Mizushima, Ayako ; Bourrier, David...
hal-04131037.  , 2023
Link: https://laas.hal.science..
 
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11

Micron-to-Submicron Cu electroplating in view of Agile-X LS..:

Shimamoto, Naonobu ; Mizushima, Ayako ; Bourrier, David...
hal-04131037.  , 2023
Link: https://laas.hal.science..
 
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12

Micron-to-Submicron Cu electroplating in view of Agile-X LS..:

Shimamoto, Naonobu ; Mizushima, Ayako ; Bourrier, David...
hal-04131037.  , 2023
Link: https://laas.hal.science..
 
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13

Clean room engineers' exchanges: a win/win international co..:

Bourrier, David ; Mizushima, Ayako ; Shimamoto, Naonobu...
hal-04476508.  , 2023
Link: https://laas.hal.science..
 
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14

Current Use and Discrepancies in the Adoption of Health-Rel..:

Sasayama, Kirio ; Nishimura, Etsuko ; Yamaji, Noyuri...
JMIR Public Health and Surveillance.  10 (2024)  - p. e51537 , 2024
Link: https://doi.org/10.2196/..
 
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15

Projections of maternal mortality ratios in Bangladesh:

Nishimura, Etsuko ; Yoneoka, Daisuke ; Rahman, Md. Obaidur...
Journal of Global Health.  14 (2024)  - p. , 2024
Link: https://doi.org/10.7189/..
 
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